Single-image far-field subdiffraction limit imaging with axicon

被引:27
作者
Snoeyink, Craig [1 ]
Wereley, Steve [2 ]
机构
[1] Texas Tech Univ, Dept Mech Engn, Lubbock, TX 79409 USA
[2] Purdue Univ, Dept Mech Engn, Birck Nanotechnol Ctr, W Lafayette, IN 47907 USA
关键词
SUPERRESOLUTION; MICROSCOPE; RESOLUTION;
D O I
10.1364/OL.38.000625
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This Letter presents a technique for subdiffraction limit imaging termed Bessel beam microscopy (BBM). By placing a lens in series with an axicon in the optical path of a microscope, the diffraction-limited resolution of the base microscope is improved by one third. This improvement is demonstrated experimentally by resolving individual subdiffraction limit fluorescent beads in a close-pack arrangement. The behavior of the BBM system is explored using angular diffraction simulations, demonstrating the possibility of resolving features spaced as little as 110 nm apart when viewed with a 100 x 1.4 NA objective. Unique among super-resolution techniques, BBM acquires subdiffraction limit information in a single image with broadband unstructured illumination using only static geometric optics placed between the microscope and camera. (C) 2013 Optical Society of America
引用
收藏
页码:625 / 627
页数:3
相关论文
共 14 条
[1]  
Born M., 1999, Principles of optics, Vseventh
[2]   Free-space beam propagation between arbitrarily oriented planes based on full diffraction theory: a fast Fourier transform approach [J].
Delen, N ;
Hooker, B .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1998, 15 (04) :857-867
[3]   DIFFRACTION-FREE BEAMS [J].
DURNIN, J ;
MICELI, JJ ;
EBERLY, JH .
PHYSICAL REVIEW LETTERS, 1987, 58 (15) :1499-1501
[4]  
Goodman J W., 2017, Introduction to Fourier Optics, V4th ed.
[5]   Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy [J].
Gustafsson, MGL .
JOURNAL OF MICROSCOPY, 2000, 198 (02) :82-87
[6]   Far-field optical nanoscopy [J].
Hell, Stefan W. .
SCIENCE, 2007, 316 (5828) :1153-1158
[7]   The theory of diffraction-limited resolution in microparticle image velocimetry [J].
Meinhart, CD ;
Wereley, ST .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2003, 14 (07) :1047-1053
[8]   Optimized pupil-plane filters for confocal microscope point-spread function engineering [J].
Neil, MAA ;
Juskaitis, R ;
Wilson, T ;
Laczik, ZJ ;
Sarafis, V .
OPTICS LETTERS, 2000, 25 (04) :245-247
[9]   Method of obtaining optical sectioning by using structured light in a conventional microscope [J].
Neil, MAA ;
Juskaitis, R ;
Wilson, T .
OPTICS LETTERS, 1997, 22 (24) :1905-1907
[10]   Fundamental limits of optical superresolution [J].
Sales, TRM ;
Morris, GM .
OPTICS LETTERS, 1997, 22 (09) :582-584