Rapid multidimensional data acquisition in scanning probe microscopy applied to local polarization dynamics and voltage dependent contact mechanics

被引：61

作者：

Jesse, Stephen ^{[1
]}

Maksymovych, Peter

Kalinin, Sergei V.

机构：

[1] Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 11期

关键词：

D O I：

10.1063/1.2980031

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A rapid multidimensional spectroscopic imaging approach in scanning probe microscopy is developed and applied to piezoresponse force spectroscopy. Evolution of resonance frequency, dissipation, and piezoresponse signal at each point during acquisition of local hysteresis loops provides information on polarization dynamics and voltage dependent contact mechanics of ferroelectric surfaces. The measurements illustrate significant frequency shifts during piezoresponse force spectroscopy, necessitating the use of frequency-tracking methods. The method is universal and can be extended to other scanning probe microscopy techniques. (C) 2008 American Institute of Physics.

引用

页数：3

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