Diffusion in binary TiO2- SiO2 glasses

被引：7
|
作者：
Kirchhof, Johannes [1 ]
Unger, Sonja [1 ]
Dellith, Jan [1 ]
Scheffel, Andy [1 ]
机构：
[1] IPHT Jena, Leibniz Inst Photon Technol, D-07745 Jena, Germany
来源：
OPTICAL MATERIALS EXPRESS | 2014年 / 4卷 / 04期
关键词：
RAY-ABSORPTION-SPECTROSCOPY; DOPED SILICA; TITANIUM SILICATE; VITREOUS SILICA; WAVE-GUIDES; CRYSTALLIZATION; PREFORM;
D O I：
10.1364/OME.4.000672
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The diffusion of titanium in TiO2-SiO2 glasses with up to 7 mol% TiO2 was investigated by annealing doped layers on the inner surface of quartz glass tubes between 1700 and 200 degrees C and measuring radial doping profiles via X-ray microprobe analysis and refractive index profiling subsequent to the tube collapse. By comparison with calculated profiles diffusion coefficients were able to be determined and fitted with an Arrhenius function. Both the preexponential D-0 = 10((0.56 + 0.51c)) cm(2)center dot s(-1) and the activation energy E = ( 473 + 11.6 center dot c) kJ center dot mol(-1) increase with increasing molar concentration of titanium c. (C) Optical Society of America
引用
收藏
页码：672 / 680
页数：9
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