共 50 条
- [46] MICROSCOPE IMAGING BY TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1992, 3 (2-3): : 119 - 139
- [50] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMER MATERIALS JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 1790 - 1794