Quantifying the Molar Percentages of Cholesterol in Supported Lipid Membranes by Time-of-Flight Secondary Ion Mass Spectrometry and Multivariate Analysis

被引:9
|
作者
Wilson, Robert L. [1 ]
Kraft, Mary L. [1 ,2 ]
机构
[1] Univ Illinois, Dept Chem, Urbana, IL 61801 USA
[2] Univ Illinois, Dept Chem & Biomol Engn, Urbana, IL 61801 USA
关键词
PRINCIPAL COMPONENT ANALYSIS; TOF-SIMS; QUANTITATIVE-ANALYSIS; PHASE-SEPARATION; MODEL; TRANSPORT; DOMAINS; QUANTIFICATION; IDENTIFICATION; REGRESSION;
D O I
10.1021/ac301856z
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The uneven cholesterol distribution among organelles and within the plasma membrane is postulated to be critical for proper cellular function. To study how interactions between cholesterol and specific lipid species contribute to the uneven cholesterol distribution between and within cellular membranes, model lipid membranes are frequently employed. Although the cholesterol distributions within membranes can be directly imaged without labels by using time-of-flight secondary ion mass spectrometry (TOF-SIMS), quantifying the cholesterol abundance at specific membrane locations in a label-free manner remains a challenge. Here, partial least-squares regression (PLSR) of TOF-SIMS data is used to quantitatively measure the local molar percentage (mol %) of cholesterol within supported lipid membranes. With the use of TOF-SIMS data from lipid membranes of known composition, a PLSR model was constructed that correlated the spectral variation to the mol % cholesterol in the membrane. The PLSR model was then used to measure the mol % cholesterol in test membranes and to measure cholesterol exchange between vesicles and supported lipid membranes. The accuracy of these measurements was assessed by comparison to the mol % cholesterol measured with conventional assays. By using this TOF-SIMS/PLSR approach to quantify the mol % cholesterol with location specificity, a better understanding of how the regional lipid composition influences cholesterol abundance and exchange in membranes may be obtained.
引用
收藏
页码:91 / 97
页数:7
相关论文
共 50 条
  • [41] Time-of-flight secondary ion mass spectrometry analysis of hair from archaeological remains
    Kempson, IM
    Skinner, WM
    Kirkbride, P
    Nelson, AJ
    Martin, RR
    EUROPEAN JOURNAL OF MASS SPECTROMETRY, 2003, 9 (06) : 589 - 597
  • [42] Time-of-flight secondary ion mass spectrometry (ToF-SIMS)
    Bertrand, P
    Weng, LT
    MIKROCHIMICA ACTA, 1996, : 167 - 182
  • [43] TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY OF POLYBUTADIENES
    HITTLE, LR
    HERCULES, DM
    SURFACE AND INTERFACE ANALYSIS, 1994, 21 (04) : 217 - 225
  • [44] Identification of human calculi with time-of-flight secondary ion mass spectrometry
    Ghumman, C. Amjad A.
    Carreira, Olga M. T.
    Moutinho, Augusto M. C.
    Tolstogouzov, Alexander
    Vassilenko, Valentina
    Teodoro, Orlando M. N. D.
    RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 2010, 24 (02) : 185 - 190
  • [45] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF PERFLUORINATED POLYETHERS
    BLETSOS, IV
    HERCULES, DM
    FOWLER, D
    VANLEYEN, D
    BENNINGHOVEN, A
    ANALYTICAL CHEMISTRY, 1990, 62 (13) : 1275 - 1284
  • [46] MICROSCOPE IMAGING BY TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY
    SCHUELER, BW
    MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1992, 3 (2-3): : 119 - 139
  • [47] Pore confined time-of-flight secondary ion electrochemical mass spectrometry
    Wang, Jun-Gang
    Yu, Ru-Jia
    Hua, Xin
    Long, Yi-Tao
    CHEMICAL SOCIETY REVIEWS, 2023, 52 (08) : 2596 - 2616
  • [48] Investigation of molecular surfaces with time-of-flight secondary ion mass spectrometry
    Aoyagi, Satoka
    Namekawa, Koki
    Yamamoto, Kenichiro
    Sakai, Kiyotaka
    Kato, Nobuhiko
    Kudo, Masahiro
    SURFACE AND INTERFACE ANALYSIS, 2010, 42 (10-11) : 1593 - 1597
  • [49] Protein Denaturation Detected by Time-of-Flight Secondary Ion Mass Spectrometry
    Killian, Manuela S.
    Krebs, Heike M.
    Schmuki, Patrik
    LANGMUIR, 2011, 27 (12) : 7510 - 7515
  • [50] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMER MATERIALS
    VANLEYEN, D
    HAGENHOFF, B
    NIEHUIS, E
    BENNINGHOVEN, A
    BLETSS, IV
    HERCULES, DM
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03): : 1790 - 1794