Microstructure evolution of Ni5Zn21 intermetallic compound at Sn-9 wt%Zn/Ni interface

被引:10
作者
Wang, Chao-hong [1 ]
Li, Po-yi [1 ]
机构
[1] Natl Chung Cheng Univ, Dept Chem Engn, Chiayi 62102, Taiwan
关键词
Ion beam analysis; Interfaces; Intermetallic compounds; Microstructure; FREE SOLDERS; NI; CU; COUPLES; GROWTH;
D O I
10.1016/j.matchemphys.2013.01.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The specific microstructure in the Ni5Zn21 layer was successfully characterized using FIB (Focused Ion Beam) microscopy system. Ni5Zn21 was the only reaction product formed in Sn-9 wt%2n/Ni interfacial reactions at 170 degrees C and 250 degrees C and various reaction times. In the initial stage of liquid-state reactions the Ni5Zn21 layer was composed of three sublayers with different microstructures. The middle sublayer (Layer II) with regular and columnar-grains was dominant and its thickness increased with reaction time. At the interface adjacent to Ni, one thin sublayer (Layer I) consisted of monolayer of column-shaped grains. The sublayer near the solder exhibited equiaxed grain structure. A new sublayer (Layer III) containing a small amount of Sn was formed between Layer II and Layer D after aging for 6 h. It had a columnar-grained structure. The thickness of the Layer III increased gradually and became dominant in the Ni5Zn21 layer. In the solid-state reactions two sublayers (Layers I and II) were present in the Ni5Zn21 layer. Layer I was consumed to form Layer II. Series of complex microstructure transformations were revealed and discussed in this study. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:937 / 943
页数:7
相关论文
共 16 条
[1]   Lead-free solders in microelectronics [J].
Abtew, M ;
Selvaduray, G .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 27 (5-6) :95-141
[2]   Unusual cruciform pattern interfacial reactions in Sn/Te couples [J].
Chen, Sinn-wen ;
Chiu, Chen-nan .
SCRIPTA MATERIALIA, 2007, 56 (02) :97-99
[3]   Phase diagrams of Pb-free solders and their related materials systems [J].
Chen, Sinn-Wen ;
Wang, Chao-Hong ;
Lin, Shih-Kang ;
Chiu, Chen-Nan .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (1-3) :19-37
[4]   Phase equilibria of the Sn-Zn-Cu ternary system [J].
Chou, Chin-Yi ;
Chen, Sinn-Wen .
ACTA MATERIALIA, 2006, 54 (09) :2393-2400
[5]   Interfacial reaction issues for lead-free electronic solders [J].
Ho, C. E. ;
Yang, S. C. ;
Kao, C. R. .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (1-3) :155-174
[6]   The formation and growth of intermetallic compounds and shear strength at Sn-Zn solder/Au-Ni-Cu interfaces [J].
Kim, KS ;
Ryu, KW ;
Yu, CH ;
Kim, JM .
MICROELECTRONICS RELIABILITY, 2005, 45 (3-4) :647-655
[7]   Diffusion of Cu and interfacial reactions during reflow of Sn-8.5Zn-0.5Ag-0.01Al-0.1Ga alloy on Ni/Cu substrate [J].
Mittal, Jagjiwan ;
Lin, Kwang Lung .
JOURNAL OF MATERIALS RESEARCH, 2012, 27 (08) :1142-1148
[8]   Investigation of interfacial reactions between Sn-Zn solder with electrolytic Ni and electroless Ni(P) metallization [J].
Sharif, Ahmed ;
Chan, Y. C. .
JOURNAL OF ALLOYS AND COMPOUNDS, 2007, 440 (1-2) :117-121
[9]   Sn-Zn low temperature solder [J].
Suganuma, Katsuaki ;
Kim, Kuen-Soo .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2007, 18 (1-3) :121-127
[10]   Sn-0.7 wt.%Cu/Ni interfacial reactions at 250°C [J].
Wang, CH ;
Chen, SW .
ACTA MATERIALIA, 2006, 54 (01) :247-253