In-situ electrical resistivity monitors the annealing process for Al-Mg-Mn aluminum alloy sheet

被引：4

作者：

Kao, Yih-Farn ^{[1
]}

Chen, Shi-Rong ^{[1
]}

Ruan, Jrjeng ^{[2
]}

机构：

[1] China Steel Corp, Aluminum Prod Res & Dev Sect, 1 Chung Kang Rd, Kaohsiung 81233, Taiwan

[2] Natl Cheng Kung Univ, Dept Mat Sci & Engn, 1 Univ Rd, Tainan 701, Taiwan

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 2018年 / 740卷

关键词：

Aluminum alloys; Electrical resistivity; Annealing; Recrystallization; Avrami equation; MICROSTRUCTURE;

D O I：

10.1016/j.jallcom.2018.01.028

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The in-situ electrical resistivity monitors the isothermal annealing history of Al-Mg-Mn aluminum alloy sheet. The resistivity-time and the yield stress-time curves well fitted with each other helps mill engineers in optimizing both the annealing time and temperature for the mill product. The resistivity-time curves are revealed as an exponential decay and interpreted by Avrami equation with R-squared values higher than 0.98. From the extended Avrami equations, the activation energy of the recrystallization is found to be 261 kJ/mol which is a reference for the future annealing experiment. This pioneering in-situ electrical resistivity system well quantitatively correlates the resistivity with the yield stress, and therefore is a potential candidate of the commercial instrument to clarify the annealing process. (C) 2018 Elsevier B.V. All rights reserved.

引用

页码：1046 / 1050

页数：5

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