Ferrite Scanning Microscope Based on Magnetic Tunnel Junction Sensor

被引：4

作者：

Jaramillo, Gerardo ^{[1
]}

Chan, Mei-Lin ^{[2
]}

Milewski, John O. ^{[3
]}

Field, Robert D. ^{[3
]}

Horsley, David A. ^{[2
]}

机构：

[1] Univ Calif Davis, Dept Elect & Comp Engn, Davis, CA 95616 USA

[2] Univ Calif Davis, Dept Mech & Aerosp Engn, Davis, CA 95616 USA

[3] Los Alamos Natl Lab, Los Alamos, NM 87544 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2012年 / 48卷 / 11期

基金：

美国国家科学基金会;

关键词：

Ferrite devices; scanning probe microscopy; tunneling magnetoresistance; STEEL;

D O I：

10.1109/TMAG.2012.2196507

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have developed a scanning magnetic microscope (SMM) based on a magnetic tunneling junction (MTJ) magnetoresistive (MR) sensor. The microscope is based on commercially available components employing two sets of scanning stages and a MTJ sensor. Spatial resolution and noise sensitivity were investigated using two MTJ sensors, one having high spatial resolution and the other low noise but coarser spatial resolution. We present measurements of magnetic field images from ferrite concentration calibration standards and a stainless steel welded specimen both imaged using a magnetoresistive scanning microscope. A sensitivity of similar to 10 mu T/FN was obtained from standards with defined ferrite numbers (FN). This microscope represents a new powerful tool for the characterization and investigations of delta ferrite concentrations in stainless steel welded samples.

引用

页码：3677 / 3680

页数：4

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