Noncontact Atomic Force Microscopy Observation of Fe3O4(001) Surface

被引：0

作者：

Mizuno, Taichi ^{[1
]}

Hosoi, Hirotaka ^{[1
]}

Subagyo, Agus ^{[1
]}

Oishi, Suguru ^{[1
]}

Ikeuchi, Akira ^{[1
]}

Hiura, Satoshi ^{[1
]}

Sueoka, Kazuhisa ^{[1
]}

机构：

[1] Hokkaido Univ, Grad Sch Informat Sci & Technol, Sapporo, Hokkaido 0600808, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2012年 / 51卷 / 08期

关键词：

SCANNING-TUNNELING-MICROSCOPY; MOLECULAR-BEAM EPITAXY; HIGH-TEMPERATURE PHASE; FILMS; RECONSTRUCTION;

D O I：

10.1143/JJAP.51.08KB03

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Fe3O4 is one of the important oxide materials and its surface structure should be well understood to enable application of this material. We report the first noncontact atomic force microscopy (NC-AFM) results for Fe3O4(001) thin films. The observed films were grown homoepitaxially on magnetite thin films substrate. A low-energy electron diffraction pattern shows the well-known d ffiffiffi root 2 x root 2)R45 degrees reconstructed structure. The observed minimum step height is 0.21 nm, corresponding to the distance between the same planes. We obtain two types of atomic-scale NC-AFM images. One image shows bright protrusions along the [100] and [010] directions at intervals of 0.84 nm corresponding to a unit cell of the root 2 x root 2)R45 degrees reconstructed structure. The other image shows a more detailed atomic structure with 0.6 and 0.3nm corrugations. (C) 2012 The Japan Society of Applied Physics

引用

页数：4

共 28 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2] Surface structure of MBE-grown Fe3O4(001) by X-ray photoelectron diffraction and scanning tunneling microscopy [J].

Chambers, SA ;

Thevuthasan, S ;

Joyce, SA .

SURFACE SCIENCE, 2000, 450 (1-2) :L273-L279

[3] Structure and magnetic properties of the Fe3O4(001) surface:: Ab initio studies -: art. no. 052401 [J].

Cheng, C .

PHYSICAL REVIEW B, 2005, 71 (05)

[4] Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of the TiO2(110) surface [J].

Enevoldsen, Georg H. ;

Pinto, Henry P. ;

Foster, Adam S. ;

Jensen, Mona C. R. ;

Kuehnle, Angelika ;

Reichling, Michael ;

Hofer, Werner A. ;

Lauritsen, Jeppe V. ;

Besenbacher, Flemming .

PHYSICAL REVIEW B, 2008, 78 (04)

[5] Surface electronic structure of the Fe3O4(100):: Evidence of a half-metal to metal transition -: art. no. 104436 [J].

Fonin, M ;

Pentcheva, R ;

Dedkov, YS ;

Sperlich, M ;

Vyalikh, DV ;

Scheffler, M ;

Rüdiger, U ;

Güntherodt, G .

PHYSICAL REVIEW B, 2005, 72 (10)

[6] Unambiguous interpretation of atomically resolved force microscopy images of an insulator [J].

Foster, AS ;

Barth, C ;

Shluger, AL ;

Reichling, M .

PHYSICAL REVIEW LETTERS, 2001, 86 (11) :2373-2376

[7] Atom-resolved image of the TiO2(110) surface by noncontact atomic force microscopy [J].

Fukui, K ;

Onishi, H ;

Iwasawa, Y .

PHYSICAL REVIEW LETTERS, 1997, 79 (21) :4202-4205

[8] WSXM:: A software for scanning probe microscopy and a tool for nanotechnology [J].

Horcas, I. ;

Fernandez, R. ;

Gomez-Rodriguez, J. M. ;

Colchero, J. ;

Gomez-Herrero, J. ;

Baro, A. M. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (01)

[9] Selective growth and characterization of pure, epitaxial alpha-Fe2O3(0001) and Fe3O4(001) films by plasma-assisted molecular beam epitaxy [J].

Kim, YJ ;

Gao, Y ;

Chambers, SA .

SURFACE SCIENCE, 1997, 371 (2-3) :358-370

[10] Surface structure of SrTiO3(100)-(√5 x √5)-R26.6° [J].

Kubo, T ;

Nozoye, H .

PHYSICAL REVIEW LETTERS, 2001, 86 (09) :1801-1804

← 1 2 3 →