Waveguide-fed longitudinal slot array antennas:: Fault diagnosis using measurements of input impedance

被引：13

作者：

Rodríguez, JA ^{[1
]}

Ares, F ^{[1
]}

Moreno, E ^{[1
]}

机构：

[1] Univ Santiago de Compostela, Fac Fis, Grp Sistemas Radiantes, Dept Fis Aplicada, Santiago De Compostela 15782, Spain

来源：

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS | 2002年 / 32卷 / 03期

关键词：

slot array antennas; waveguide-fed antennas; antenna arrays;

D O I：

10.1002/mop.10130

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This communication presents a method of locating defective elements of longitudinal broadwall slot array antennas. The method assumes defects to consist of partial obturation of the slots, and is based on measurement of the input impedance of tire antenna. A genetic optimization algorithm finds the configuration of defective elements that best corresponds to the measured impedance. (C) 2002 John Wiley Sons, Inc.

引用

页码：200 / 201

页数：2

共 5 条

[1] Diagnosis of array faults from far-field amplitude-only data [J].