Growth of High-Quality Perovskite KTa1-xNbxO3 Thin Films by RF Magnetron Co-Sputtering

被引:0
|
作者
Kang, Geon-Hyeong [1 ]
Jung, Ki Chul [1 ]
Kim, Jongbum [1 ]
Kang, JoonHyun [1 ]
Kim, In Soo [1 ,2 ]
Kim, Young-Hwan [1 ]
机构
[1] Korea Inst Sci & Technol, Nanophoton Res Ctr, Seoul, South Korea
[2] Sungkyunkwan Univ SKKU, KIST SKKU Carbon Neutral Res Ctr, Suwon 16419, South Korea
关键词
ferroelectricity; high-resolution X-ray diffraction; potassium tantalate niobate; RF magnetron co-sputtering; Raman spectroscopy; spectroscopic ellipsometry; thin films; PULSED-LASER DEPOSITION; REFRACTIVE-INDEX; CRYSTALLIZATION; BEHAVIOR;
D O I
10.3390/coatings12111787
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, we demonstrate the growth of high-quality KTa1-xNbxO3 (KTN) thin films by using multi-target radio frequency (RF) magnetron co-sputtering with KTaO3, KNbO3, and K2CO3 targets. KTaO3 and KNbO3 targets were used to control the Ta/Nb ratio while the K2CO3 target was used to supply excess potassium (K) to compensate for the K deficiency. Through careful control of the RF powers applied to each target, high-quality perovskite KTN (x = 0.53) thin films were grown on various single crystal substrates. Variable temperature Raman spectroscopy revealed that the KTN thin films exhibit a ferroelectric phase at room temperature with a Curie temperature of similar to 403 K. The optical constants n and k of the KTN thin film were also similar to those reported for single KTN crystals. These results present a simple route toward fabricating high-quality perovskite KTN thin films with desired structural and optical properties for various device applications utilizing the RF magnetron co-sputtering method.
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页数:11
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