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Growth of High-Quality Perovskite KTa1-xNbxO3 Thin Films by RF Magnetron Co-Sputtering
被引:0
|作者:
Kang, Geon-Hyeong
[1
]
Jung, Ki Chul
[1
]
Kim, Jongbum
[1
]
Kang, JoonHyun
[1
]
Kim, In Soo
[1
,2
]
Kim, Young-Hwan
[1
]
机构:
[1] Korea Inst Sci & Technol, Nanophoton Res Ctr, Seoul, South Korea
[2] Sungkyunkwan Univ SKKU, KIST SKKU Carbon Neutral Res Ctr, Suwon 16419, South Korea
来源:
关键词:
ferroelectricity;
high-resolution X-ray diffraction;
potassium tantalate niobate;
RF magnetron co-sputtering;
Raman spectroscopy;
spectroscopic ellipsometry;
thin films;
PULSED-LASER DEPOSITION;
REFRACTIVE-INDEX;
CRYSTALLIZATION;
BEHAVIOR;
D O I:
10.3390/coatings12111787
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
In this study, we demonstrate the growth of high-quality KTa1-xNbxO3 (KTN) thin films by using multi-target radio frequency (RF) magnetron co-sputtering with KTaO3, KNbO3, and K2CO3 targets. KTaO3 and KNbO3 targets were used to control the Ta/Nb ratio while the K2CO3 target was used to supply excess potassium (K) to compensate for the K deficiency. Through careful control of the RF powers applied to each target, high-quality perovskite KTN (x = 0.53) thin films were grown on various single crystal substrates. Variable temperature Raman spectroscopy revealed that the KTN thin films exhibit a ferroelectric phase at room temperature with a Curie temperature of similar to 403 K. The optical constants n and k of the KTN thin film were also similar to those reported for single KTN crystals. These results present a simple route toward fabricating high-quality perovskite KTN thin films with desired structural and optical properties for various device applications utilizing the RF magnetron co-sputtering method.
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页数:11
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