Roughness and Texture of Epitaxial LZO Thin Films Grown on RABiTS Ni5W Substrates

被引:3
作者
Soubeyroux, Jean-Louis [1 ]
Petit, Sarah [1 ]
Mikolajczyk, Melissa [1 ]
Muguerra, Herve [1 ]
Pairis, Sebastien [1 ]
Odier, Philippe [1 ]
机构
[1] CNRS, CRETA, Inst Neel, F-38042 Grenoble, France
关键词
Coated conductors; defects; high-temperature superconductors; superconducting films; LA2ZR2O7 BUFFER LAYERS; YBCO-COATED CONDUCTORS; CHEMICAL SOLUTION DEPOSITION;
D O I
10.1109/TASC.2013.2241811
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Low-cost coated conductors are required in order to put together competitive superconducting cables. The buffer layer architecture is one of the key aspects of coated conductors processing. Very interesting results have been obtained with complex architectures. It may not be necessary to have high J(c) for cable applications, thus simpler architectures can be considered. We suggest that only one buffer could be sufficient. Because the YBCO deposition needs a perfect surface for epitaxy, we aim to eliminate the different defects appearing on this surface. To do so, we suggest to identify the defects. We show the annealing results of the NiW/LZO substrates with La2Zr2O7 deposited by metal organic decomposition at different annealing temperatures. The buffer layer microstructure is studied in detail, and the texture is investigated as a function of the annealing temperature.
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页数:4
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