Cryogenic Self-Calibrating Noise Parameter Measurement System

被引:7
作者
Russell, Damon [1 ]
Weinreb, Sander [1 ]
机构
[1] CALTECH, Dept Elect Engn, Pasadena, CA 91125 USA
基金
美国国家航空航天局;
关键词
Low-noise amplifiers (LNAs); noise; noise measurement;
D O I
10.1109/TMTT.2012.2188813
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A system for measuring the noise parameters of a device at cryogenic temperatures is described. The method includes the thermal calibration of a module consisting of a noise diode, a dispersive coupling network, a temperature sensor, heater, and a bias-tee. The magnitude and phase of the reflection coefficient presented by the module vary rapidly with frequency and the noise output of the module can be thermally calibrated by changing the temperature of the module with an internal heater. The resulting variable impedance-calibrated noise source can be used to measure noise parameters of transistors or amplifiers over a frequency range of 0.4 to 12 GHz via the wideband frequency-variation method. The calibration scheme is not unique to the module and may be applied in general to any noise source. Calibration and noise parameter measurements are made at cryogenic temperatures on a discrete transistor and two different low-noise amplifiers. The results are compared against theoretical values and those obtained using independent measurements. To the best of the authors' knowledge, this is the first measurement of a transistor's noise parameters at cryogenic temperatures using such techniques.
引用
收藏
页码:1456 / 1467
页数:12
相关论文
共 50 条
[41]   Identification of linear parameter-varying system with missing measurement data and outliers [J].
Chen, Xiang ;
Wang, Xiaogang ;
Liu, Fei .
JOURNAL OF THE FRANKLIN INSTITUTE, 2025, 362 (04)
[42]   An LED Strobe Scanning System for Enhanced Measurement Accuracy, Flexibility, and Noise Reduction [J].
An, Huijun ;
Kong, Lingbao ;
Wang, Yuhan ;
Xu, Xialiang ;
Xu, Min .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2025, 74
[43]   Development and characterzation of a low-frequency noise measurement system for optoelectronic devices [J].
Jankovec, Marko ;
Topic, Marko .
INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 2007, 37 (02) :80-86
[44]   Technical Feasibility for the Mobile Measurement of Noise Pollution by Remotely Piloted Aircraft System [J].
Rodriguez Timana, Luis Carlos ;
Saavedra Lozano, Diego Fernando ;
Diaz Velasquez, Maria Fernanda ;
Castillo Garcia, Javier Ferney .
APPLIED TECHNOLOGIES (ICAT 2019), PT III, 2020, 1195 :219-230
[45]   Variable aperture & dynamic scanning noise measurement system of photoelectric imaging device [J].
Bai, LF ;
Sun, SY ;
Xu, R ;
Zhang, BM .
PHOTONIC SYSTEMS AND APPLICATIONS, 2001, 4595 :231-236
[46]   Parameter estimation of delay dynamical system from a scalar time series under external noise [J].
Ghosh, Dibakar ;
Chowdhury, A. Roy .
APPLIED MATHEMATICS AND COMPUTATION, 2010, 216 (07) :2069-2076
[47]   Measurement of real personal noise attenuation using earplugs with the E-A-Rfit™ system [J].
Cassano, F. ;
Aloise, Ingrid ;
Labianca, G. ;
Gaccione, V. ;
Mazzotta, C. ;
Cardascia, F. ;
Garavaglia, Michela ;
Scarselletta, R. S. ;
Di Lorenzo, L. .
MEDICINA DEL LAVORO, 2013, 104 (03) :213-223
[48]   The measurement and calculation of the kinetic parameter βeff/Λ of a small high-temperature like, critical system [J].
Wallerbos, EJM ;
Hoogenboom, JE .
JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY, 1998, 35 (01) :26-33
[49]   Phase transitions induced by complex nonlinear noise in a system of self-propelled agents [J].
Dossetti, V. ;
Sevilla, F. J. ;
Kenkre, V. M. .
PHYSICAL REVIEW E, 2009, 79 (05)
[50]   Ultralow-noise PC-based measurement system for the characterization of the metallizations of integrated circuits [J].
Ciofi, C ;
DeMarinis, M ;
Neri, B .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1997, 46 (04) :789-793