Suppression Technique of fast-shear-wave Spurious Responses in SAW Resonators on SiO2/Al/LiNbO3 Structure

被引:2
作者
Fujiwara, J. [1 ]
Goto, R. [1 ]
Nakamura, H. [1 ]
Tsurunari, T. [1 ]
Nakanishi, H. [1 ]
Hamaoka, Y. [1 ]
机构
[1] Panasonic Corp, Ind Devices Co, Kadoma, Osaka, Japan
来源
2012 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS) | 2012年
关键词
SiO2/Al/LiNbO3; structure; Spurious response; SAW resonator; tempature coefficient; DUPLEXER; PROPAGATION; US;
D O I
10.1109/ULTSYM.2012.0199
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
SH mode on SiO2/Al/LiNbO3 structure is studied because of their sufficient electromechanical coupling factor (K-2) and good temperature coefficient of frequency (TCF). Authors proposed the suppression method of the spurious response of the Rayleigh mode and the transverse mode for the narrow duplex gap application. For the narrow duplex gap application, SiO2 thickness must be increased to achieve the good TCF characteristics. However, another spurious response is appeared near the fist-shear-wave as increasing the SiO2 thickness. This paper discusses the suppression mechanism of the spurious response near the fast-shear-wave.
引用
收藏
页码:799 / 802
页数:4
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