Bayesian Optimization Approach for Analog Circuit Synthesis Using Neural Network

被引:0
作者
Zhang, Shuhan [1 ]
Lyu, Wenlong [1 ]
Yang, Fan [1 ]
Yan, Changhao [1 ]
Zhou, Dian [1 ,2 ]
Zeng, Xuan [1 ]
机构
[1] Fudan Univ, Microelect Dept, State Key Lab ASIC & Syst, Shanghai, Peoples R China
[2] Univ Texas Dallas, Dept Elect Engn, Richardson, TX 75083 USA
来源
2019 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE) | 2019年
基金
中国国家自然科学基金;
关键词
Bayesian optimization; Gaussian process; Neural Network; Analog Circuit Synthesis;
D O I
10.23919/date.2019.8714788
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Bayesian optimization with Gaussian process as surrogate model has been successfully applied to analog circuit synthesis. In the traditional Gaussian process regression model, the kernel functions are defined explicitly. The computational complexity of training is O (N-3), and the computation complexity of prediction is O(N-2), where N is the number of training data. Gaussian process model can also be derived from a weight space view, where the original data are mapped to feature space, and the kernel function is defined as the inner product of nonlinear features. In this paper, we propose a Bayesian optimization approach for analog circuit synthesis using neural network. We use deep neural network to extract good feature representations, and then define Gaussian process using the extracted features. Model averaging method is applied to improve the quality of uncertainty prediction. Compared to Gaussian process model with explicitly defined kernel functions, the neural-network-based Gaussian process model can automatically learn a kernel function from data, which makes it possible to provide more accurate predictions and thus accelerate the follow-up optimization procedure. Also, the neural-network-based model has O(N) training time and constant prediction time. The efficiency of the proposed method has been verified by two real-world analog circuits.
引用
收藏
页码:1463 / 1468
页数:6
相关论文
共 50 条
  • [21] Prognosis of LED lumen degradation using Bayesian optimized neural network approach
    Pugalenthi, Karkulali
    Lim, Sze Li Harry
    Park, Hyunseok
    Hussain, Shaista
    Raghavan, Nagarajan
    MICROELECTRONICS RELIABILITY, 2022, 138
  • [22] Copper price forecasted by hybrid neural network with Bayesian Optimization and wavelet transform
    Liu, Kailei
    Cheng, Jinhua
    Yi, Jiahui
    RESOURCES POLICY, 2022, 75
  • [23] Analog Circuit Soft Fault Diagnosis Based on Chaotic Neural Network
    Liu, Meirong
    Zeng, Li
    Zhang, Liwei
    He, Yigang
    PROCEEDINGS OF THE 2016 INTERNATIONAL CONFERENCE ON MECHATRONICS, CONTROL AND AUTOMATION ENGINEERING (MCAE), 2016, 58 : 201 - 205
  • [24] Nonlinear Analog Circuit Diagnosis Based on Volterra Series and Neural Network
    Yin Shirong
    2010 6TH INTERNATIONAL CONFERENCE ON WIRELESS COMMUNICATIONS NETWORKING AND MOBILE COMPUTING (WICOM), 2010,
  • [25] Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation
    Guo, Nanlin
    Peng, Fulin
    Shi, Jiahe
    Yang, Fan
    Tao, Jun
    Zeng, Xuan
    ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2024, 29 (01)
  • [26] Estimation of Obesity Levels with a Trained Neural Network Approach optimized by the Bayesian Technique
    Yagin, Fatma Hilal
    Gulu, Mehmet
    Gormez, Yasin
    Castaneda-Babarro, Arkaitz
    Colak, Cemil
    Greco, Gianpiero
    Fischetti, Francesco
    Cataldi, Stefania
    APPLIED SCIENCES-BASEL, 2023, 13 (06):
  • [27] Architecture-Aware Bayesian Optimization for Neural Network Tuning
    Sjoberg, Anders
    Onnheim, Magnus
    Gustavsson, Emil
    Jirstrand, Mats
    ARTIFICIAL NEURAL NETWORKS AND MACHINE LEARNING - ICANN 2019: DEEP LEARNING, PT II, 2019, 11728 : 220 - 231
  • [28] Neural Network Method for Fault Diagnosis of Analog Circuit Based on Kurtosis and Skewness
    Xie, Tao
    Li, Heng
    2018 INTERNATIONAL CONFERENCE ON COMMUNICATION, NETWORK AND ARTIFICIAL INTELLIGENCE (CNAI 2018), 2018, : 89 - 95
  • [29] Feature evaluation and extraction based on neural network in analog circuit fault diagnosis
    Yuan Haiying
    Chen Guangju
    Xie Yongle
    JOURNAL OF SYSTEMS ENGINEERING AND ELECTRONICS, 2007, 18 (02) : 434 - 437