Jamin double-shearing interferometer for diffraction-limited wave-front test

被引:19
作者
Luan, Z [1 ]
Liu, LR [1 ]
Liu, DA [1 ]
Teng, SY [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
关键词
D O I
10.1364/AO.43.001819
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A Jamin double-shearing interferometer with three changeable schemes is proposed for the measurement of diffraction-limited laser wave front. A concept of detectable wave-front height is thus defined, and on this basis the limits of detectable wave-front height from the suggested schemes of interferometer are analyzed. The design is detailed, the simulation for wave aberrations is given, and the experiment is demonstrated. One of the major features of this interferometer is that it is capable of visually testing a diffraction-limited wave front immediately by the fringes with the matched accuracy and minimum detectable wave-front height on the order of 0.1lambda. (C) 2004 Optical Society of America
引用
收藏
页码:1819 / 1824
页数:6
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