Compressive single-pixel snapshot x-ray diffraction imaging

被引：109
作者：
Greenberg, Joel [1 ]
Krishnamurthy, Kalyani [1 ]
Brady, David [1 ]
机构：
[1] Duke Univ, Dept Elect & Comp Engn, Durham, NC 27708 USA
来源：
OPTICS LETTERS | 2014年 / 39卷 / 01期
关键词：
D O I：
10.1364/OL.39.000111
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present a method for realizing snapshot, depth-resolved material identification using only a single, energy-sensitive pixel. To achieve this result, we employ a coded aperture with subpixel features to modulate the energy spectrum of coherently scattered photons and recover the object properties using an iterative inversion algorithm based on compressed sensing theory. We demonstrate high-fidelity object estimation at x-ray wavelengths for a variety of compression ratios exceeding unity. (C) 2013 Optical Society of America
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收藏
页码：111 / 114
页数：4
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