A resonant magnetic field microsensor with high quality factor at atmospheric pressure

被引:52
作者
Herrera-May, A. L. [1 ,2 ]
Garcia-Ramirez, P. J. [1 ]
Aguilera-Cortes, L. A. [2 ]
Martinez-Castillo, J. [1 ]
Sauceda-Carvajal, A. [1 ]
Garcia-Gonzalez, L. [1 ]
Figueras-Costa, E. [3 ]
机构
[1] Univ Veracruzana, Ctr Invest Micro & Nanotenol, Boca Del Rio 94292, Ver, Mexico
[2] Univ Guanajuato, Salamanca, Gto, Spain
[3] CSIC, CNM, Barcelona 08193, Spain
关键词
1/F NOISE; SENSORS; OPTIMIZATION; DESIGN;
D O I
10.1088/0960-1317/19/1/015016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A resonant magnetic field microsensor with a high quality factor at atmospheric pressure has been designed, fabricated and tested. This microsensor does not require vacuum packaging to operate efficiently and presents a compact and simple geometrical configuration of silicon. This geometry permits us to decrease the size of the structure and facilities its fabrication and operation. It is constructed of a seesaw plate (400 x 150 x 15 mu m(3)), two torsional beams (60 x 40 x 15 mu m(3)), four flexural beams (130 x 12 x 15 mu m(3)) and a Wheatstone bridge with four p-type piezoresistors. The resonant device exploits the Lorentz force principle and operates at its first resonant frequency (136.52 kHz). A sinusoidal excitation current of 22.0 mA with a frequency of 136.52 kHz and magnetic fields from 1 to 400 G are considered. The mechanical response of the microsensor is modeled with the finite element method (FEM). The structure of the microsensor registered a maximum von Mises stress of 53.8 MPa between the flexural and the torsional beams. Additionally, a maximum deflection (372.5 nm) is obtained at the extreme end of the plate. The proposed microsensor has the maximum magnetic sensitivity of 40.3 mu V G(-1) (magnetic fields < 70 G), theoretical root-mean square (rms) noise voltage of 57.48 nV Hz(-1/2), theoretical resolution of 1.43 mG Hz(-1/2) and power consumption less than 10.0 mW.
引用
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页数:11
相关论文
共 24 条
[1]   Modeling and fabrication of a MEMS magnetostatic magnetic sensor [J].
Ciudad, D ;
Aroca, C ;
Sánchez, MC ;
Lopez, E ;
Sánchez, P .
SENSORS AND ACTUATORS A-PHYSICAL, 2004, 115 (2-3) :408-416
[2]   Sources of excess noise in silicon piezoresistive microphones [J].
Dieme, Robert ;
Bosman, Gijs ;
Nishida, Toshikazu ;
Sheplak, Mark .
JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 2006, 119 (05) :2710-2720
[3]   LOW-FREQUENCY FLUCTUATIONS IN SOLIDS - 1-F NOISE [J].
DUTTA, P ;
HORN, PM .
REVIEWS OF MODERN PHYSICS, 1981, 53 (03) :497-516
[4]   Resonant mechanical magnetic sensor in standard CMOS [J].
Eyre, B ;
Pister, KSJ ;
Kaiser, W .
IEEE ELECTRON DEVICE LETTERS, 1998, 19 (12) :496-498
[5]  
Gad-el-Hak M., 2002, The MEMS Handbook, V2
[6]   An analytical model for support loss in micromachined beam resonators with in-plane flexural vibrations [J].
Hao, ZL ;
Erbil, A ;
Ayazi, F .
SENSORS AND ACTUATORS A-PHYSICAL, 2003, 109 (1-2) :156-164
[7]   1/F noise considerations for the design and process optimization of piezoresistive cantilevers [J].
Harley, JA ;
Kenny, TW .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2000, 9 (02) :226-235
[8]   1/F NOISE SOURCES [J].
HOOGE, FN .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (11) :1926-1935
[9]  
Hsu T.R., 2002, MEMS MICROSYSTEMS
[10]   Magnetic-field measurements using an integrated resonant magnetic-field sensor [J].
Kadar, Z ;
Bossche, A ;
Sarro, PM ;
Mollinger, JR .
SENSORS AND ACTUATORS A-PHYSICAL, 1998, 70 (03) :225-232