Tight focusing properties of phase modulated transversely polarized sinh Gaussian beam

被引：11

作者：

Sundaram, C. Mohana ^{[1
]}

Prabakaran, K. ^{[2
]}

Anbarasan, P. M. ^{[1
]}

Rajesh, K. B. ^{[3
]}

Musthafa, A. Mohamed ^{[4
]}

Aroulmoji, V. ^{[5
]}

机构：

[1] Periyar Univ, Dept Phys, Salem, Tamil Nadu, India

[2] Mahendra Arts & Sci Coll Autonomous, Dept Phys, Namakkal, Tamil Nadu, India

[3] Chikkanna Govt Arts Coll, Dept Phys, Tiruppur, Tamil Nadu, India

[4] Royal Commiss Jubail, Jubail Univ Coll, Male Branch, Dept Gen Studies,Phys Grp, Jubail Ind City, Saudi Arabia

[5] Mahendra Educ Inst, Ctr Res & Dev, Namakkal, Tamil Nadu, India

来源：

OPTICAL AND QUANTUM ELECTRONICS | 2017年 / 49卷 / 01期

关键词：

Vector diffraction theory; High NA lens; Transversely polarized sinh beam; ELECTROMAGNETIC DIFFRACTION; OPTICAL SYSTEMS; GENERATION; PROPAGATION; AMPLITUDE; FIELD;

D O I：

10.1007/s11082-016-0857-7

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We studied the tight focusing properties of an azimuthally polarized sinh-Gaussian beam phase modulated with multi belt vortex phase filter on the basis of the vector diffraction theory. The sinh-Gaussian beam can be considered as superposition of a series of eccentric Gaussian beams and it is observed that focusing such a beam with a properly designed dedicated vortex phase filter generates many novel focal patterns including transversely polarized optical needle of extended focal depth with sub wavelength scale lateral resolution and mutiple focal spots with different axial seperation distance. We expect that such a focal patterns are usefull in applications such as semiconductor inspection and multiple optical trapping.

引用

页数：10

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