Band Structure Effects on the Scaling Properties of [111] InAs Nanowire MOSFETs

被引:46
作者
Lind, Erik [1 ,2 ]
Persson, Martin P. [3 ]
Niquet, Yann-Michel [3 ]
Wernersson, Lars-Erik [1 ]
机构
[1] Lund Univ, Dept Solid State Phys, S-22100 Lund, Sweden
[2] Qumat Technol AB, S-22224 Lund, Sweden
[3] Inst Nanosci & Cryogen SP2M LSim, Commissariat Energie Atom, F-38054 Grenoble, France
基金
瑞典研究理事会;
关键词
Band structure; field-effect transistor (FET); InAs; nanowire; FIELD-EFFECT TRANSISTOR; GATE; SEMICONDUCTORS; PARAMETERS;
D O I
10.1109/TED.2008.2010587
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have investigated the scaling properties of [111] InAs nanowire MOSFETs in the ballistic limit. The nanowire band structure has been calculated with an Sp(3)d(5)s* tight-binding model for nanowire diameters between 2 and 25 nm. Both the effective band gap and the effective masses increase with confinement. Using the atomistic dispersion relations, the ballistic currents and corresponding capacitances have been calculated with a semianalytical model. It is shown that the InAs nanowire MOSFET with diameters scaled below 15-20 nm can be expected to operate close to the quantum capacitance limit, assuming a high-kappa dielectric thickness of 1-1.5 nm. We have also investigated the evolution of f(t) and the gate delay, both showing improvements as the device is scaled. The very small intrinsic gate capacitance in the quantum limit makes the device susceptible to parasitic capacitances.
引用
收藏
页码:201 / 205
页数:5
相关论文
共 17 条
[1]   Scaling theory for cylindrical, fully-depleted, surrounding-gate MOSFET's [J].
Auth, CP ;
Plummer, JD .
IEEE ELECTRON DEVICE LETTERS, 1997, 18 (02) :74-76
[2]   Heterostructure barriers in wrap gated nanowire FETs [J].
Froeberg, Linus E. ;
Rehnstedt, Carl ;
Thelander, Claes ;
Lind, Erik ;
Wernersson, Lars-Erik ;
Samuelson, Lars .
IEEE ELECTRON DEVICE LETTERS, 2008, 29 (09) :981-983
[3]   Empirical spds* tight-binding calculation for cubic semiconductors: General method and material parameters [J].
Jancu, JM ;
Scholz, R ;
Beltram, F ;
Bassani, F .
PHYSICAL REVIEW B, 1998, 57 (11) :6493-6507
[4]   InAs/InP radial nanowire heterostructures as high electron mobility devices [J].
Jiang, Xiaocheng ;
Xiong, Qihua ;
Nam, Sungwoo ;
Qian, Fang ;
Li, Yat ;
Lieber, Charles M. .
NANO LETTERS, 2007, 7 (10) :3214-3218
[5]  
Lundstrom M., 2005, NANOSCALE TRANSISTOR
[6]   Epitaxial growth of indium arsenide nanowires on silicon using nucleation templates formed by self-assembled organic coatings [J].
Martensson, Thomas ;
Wagner, Jakob B. ;
Hilner, Emelie ;
Mikkelsen, Anders ;
Thelander, Claes ;
Stangl, Julian ;
Ohlsson, Bjorn Jonas ;
Gustafsson, Anders ;
Lundgren, Edvin ;
Samuelson, Lars ;
Seifert, Werner .
ADVANCED MATERIALS, 2007, 19 (14) :1801-+
[7]   Bandstructure effects in silicon nanowire electron transport [J].
Neophytou, Neophytos ;
Paul, Abhijeet ;
Lundstrom, Mark S. ;
Klimeck, Gerhard .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (06) :1286-1297
[8]   Electronic structure of semiconductor nanowires [J].
Niquet, YM ;
Lherbier, A ;
Quang, NH ;
Fernández-Serra, MV ;
Blase, X ;
Delerue, C .
PHYSICAL REVIEW B, 2006, 73 (16)
[9]   Theory of ballistic nanotransistors [J].
Rahman, A ;
Guo, J ;
Datta, S ;
Lundstrom, MS .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (09) :1853-1864
[10]   InAs nanowire metal-oxide-semiconductor capacitors [J].
Roddaro, Stefano ;
Nilsson, Kristian ;
Astromskas, Gvidas ;
Samuelson, Lars ;
Wernersson, Lars-Erik ;
Karlstrom, Olov ;
Wacker, Andreas .
APPLIED PHYSICS LETTERS, 2008, 92 (25)