Experimental evidence of correlation between 1/f noise level and metal-to-insulator transition temperature in epitaxial La0.7Sr0.3MnO3 thin films

被引:20
作者
Mechin, L. [1 ]
Wu, S. [1 ]
Guillet, B. [1 ]
Perna, P. [1 ,2 ]
Fur, C. [1 ]
Lebargy, S. [1 ]
Adamo, C. [3 ]
Schlom, D. G. [3 ,4 ]
Routoure, J. M. [1 ]
机构
[1] GREYC UMR 6072 CNRS ENSICAEN Univ Caen Basse Norm, F-14050 Caen, France
[2] IMDEA Nanociencia, Madrid 28049, Spain
[3] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
[4] Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA
关键词
MAGNETIC-ANISOTROPY; BOLOMETRIC APPLICATIONS; STRAIN RELAXATION; MAGNETORESISTANCE; LA1-XSRXMNO3; DEPENDENCE; THICKNESS; LA2/3SR1/3MNO3; DEPOSITION; CRYSTAL;
D O I
10.1088/0022-3727/46/20/202001
中图分类号
O59 [应用物理学];
学科分类号
摘要
The relation between lattice deformation, dc electrical properties and 1/f noise at room temperature was investigated experimentally in two series of high epitaxial La0.7Sr0.3MnO3 (LSMO) thin films of various thicknesses. The first series was deposited on SrTiO3 (0 0 1) single crystal substrates by pulsed laser deposition and the second one on SrTiO3-buffered Si (0 0 1) substrates by reactive-molecular-beam epitaxy. A clear correlation was found between 1/f noise level and the temperature of the metal-to-insulator transition. These findings are important in view of the optimization of LSMO thin films for applications in sensors.
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页数:6
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