Development of a laboratory system hard X-ray photoelectron spectroscopy and its applications

被引:28
作者
Kobayashi, Keisuke [1 ,2 ]
Kobata, Masaaki [3 ]
Iwai, Hideo [4 ]
机构
[1] Hiroshima Univ, Hiroshima Synchrotron Radiat Ctr, Higashihiroshima, Hiroshima 7390046, Japan
[2] Japan Atom Energy Agcy, Quantum Beam Sci Directorate, Sayo, Hyogo 6795148, Japan
[3] Natl Inst Mat Sci, Synchrotron Xray Beam Stn SPring 8, Sayo, Hyogo 6795148, Japan
[4] Natl Inst Mat Sci, Mat Anal Stn, Tsukuba, Ibaraki 3050047, Japan
基金
日本科学技术振兴机构;
关键词
Laboratory HXPES system; Cr K alpha X-ray source; Angle resolved wide angle objective lens; VERWEY TRANSITION; AMBIENT-PRESSURE; SCIENCE; SURFACE;
D O I
10.1016/j.elspec.2013.04.007
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Development of a laboratory hard X-ray photoelectron spectrometer using excitations by monochromatic Cr K alpha X-rays of 5.4 keV and a high energy analyzer with a wide acceptance angle resolved objective lens is introduced. Wide applicability of the system as a powerful tool for the investigations of electronic and chemical states of materials are demonstrated by various examples including bulk sensitive valence band and core level spectroscopy, overlayer thickness determination by photoelectron take off angle dependence measurements, buried layer analysis, bulk sensitive photoelectron diffraction to determine surface polarity of compound single and poly crystalline films, interface state spectroscopy in MOS structures by applying voltage bias, and environmental cell for high pressure photoelectron spectroscopy. These results evidently show the laboratory HXPES system is going to be indispensable in wide varieties of targets. It also opens up opportunities of the analysis of materials which are not accessible to beamlines due to limitations by safety control regulation and avoidance of risks to the beamlines. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:210 / 221
页数:12
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