Raman scattering study on Sb spray InAs/GaAs quantum dot nanostructure systems
被引:3
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作者:
Dai, Liping
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机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
Univ Sydney, Australian Ctr Microscopy & Microanal, Chem Engn Bldg, Sydney, NSW 2006, AustraliaUniv Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
Dai, Liping
[1
,2
]
Bremner, Stephen P.
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机构:
Univ New South Wales, Sch Photovolta & Renewable Energy Engn, Sydney, NSW 2052, AustraliaUniv Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
Bremner, Stephen P.
[3
]
Tan, Shenwei
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机构:
Univ Sydney, Australian Ctr Microscopy & Microanal, Chem Engn Bldg, Sydney, NSW 2006, AustraliaUniv Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
Tan, Shenwei
[2
]
Wang, Shuya
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机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
Wang, Shuya
[1
]
Zhang, Guojun
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机构:
Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R ChinaUniv Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
Zhang, Guojun
[1
]
Liu, Zongwen
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机构:
Univ Sydney, Australian Ctr Microscopy & Microanal, Chem Engn Bldg, Sydney, NSW 2006, AustraliaUniv Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
Liu, Zongwen
[2
]
机构:
[1] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devie, 4,Sect 2,Jianshe North Rd, Chengdu 610054, Peoples R China
[2] Univ Sydney, Australian Ctr Microscopy & Microanal, Chem Engn Bldg, Sydney, NSW 2006, Australia
[3] Univ New South Wales, Sch Photovolta & Renewable Energy Engn, Sydney, NSW 2052, Australia
来源:
NANOSCALE RESEARCH LETTERS
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2015年
/
10卷
基金:
澳大利亚研究理事会;
中国国家自然科学基金;
关键词:
InAs;
Quantum dots;
Raman spectra;
Sb spray;
D O I:
10.1186/s11671-015-0908-1
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
The effect of Sb spray time on the structure of InAs/GaAs quantum dot (QD) systems with Sb spray prior to the capping of a GaAs layer was determined by a Raman scattering study. The Raman spectra of the InAs/GaAs system show two phonon signal bands related to interface (IF) defects, located at the low-energy side of InAs QDs and GaAs cap layer main phonon peaks, respectively. The intensity ratio of the IF defect relative phonon signal to its corresponding main peak shows a significant decrease with the Sb spray time increasing from 0 to 15 s, but increases for spray times larger than 15 s. In addition, the InAs QD phonon peaks appear to be resolved with improved symmetry for 15 s of spray time. Finally, the GaAs transverse optical (TO) phonon peak is seen to vary with Sb spray time, both in terms of the intensity and the peak position, in a similar manner to the other results. Taken together, these results suggest the InAs/GaAs QDs with a 15-s Sb spray lead to a GaAs capping layer with less strain at the IF with the QDs and a lower density of crystalline defects.