Detection of visual defects on rotationally symmetric objects

被引:2
作者
Smid, Petr [1 ,2 ,3 ,4 ]
Havranek, Vitezslav [3 ,4 ]
Ivanov, Georgi [1 ,2 ,3 ,4 ]
机构
[1] Palacky Univ, FZU Inst Phys, Joint Lab Opt, Czech Acad Sci, 17 Listopadu 12, Olomouc 77146, Czech Republic
[2] Acad Sci Czech Republ, Inst Phys, 17 Listopadu 12, Olomouc 77146, Czech Republic
[3] Palacky Univ, Joint Lab Opt, 17 Listopadu 12, Olomouc 77146, Czech Republic
[4] Palacky Univ Olomouc, Inst Phys, Acad Sci Czech Republ, Fac Sci, 17 Listopadu 12, Olomouc 77146, Czech Republic
关键词
SURFACE-DEFECTS; SYSTEM; INSPECTION;
D O I
10.1364/JOSAA.394091
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The paper describes a method using digital image processing in the detection of vaguely defined visual defects on objects symmetric with respect to a rotation axis. Automotive wheels and hubcaps, fans, turbines, symmetrical ceramic goods, merchandise, etc., are examples of such objects. The method uses the object's surface symmetry to identify areas that do not meet the requirement for the symmetry. The method is based on the brightness comparison of areas of the object's surface under test corresponding to each other with respect to the object's rotational symmetry. The area containing a defect is located through the difference between its brightness and average brightness of the all symmetric areas. The reliability of the method requires opaque and not too broken surfaces with solitary defects that do not overlap when the object is rotated. The method is advantageous for larger defects. Minimum defect size is limited by segmentation of the object and its production tolerances. Uniform illumination is another prerequisite for the reliable detection of the defects. This work focuses on testing the method and determination of the optimum brightness difference characterizing the defect. Next, limitations of the method are analyzed, especially the relationship between the uncertainty of the object shape, the camera resolution, and the minimum size of the detected defect. (C) 2020 Optical Society of America
引用
收藏
页码:1583 / 1594
页数:12
相关论文
共 20 条
[11]  
Gonzalez R.C., 2018, Digital image processing
[12]  
Grote A., 2009, Patent, Patent No. [DE102008027904, 102008027904]
[13]  
HAN JH, 1993, P SOC PHOTO-OPT INS, V1907, P114, DOI 10.1117/12.144804
[14]   An efficient method for texture defect detection:: sub-band domain co-occurrence matrices [J].
Latif-Amet, A ;
Ertüzün, A ;
Erçil, A .
IMAGE AND VISION COMPUTING, 2000, 18 (6-7) :543-553
[15]  
Luckenhaus M., 2016, EUROPHOTONICS, V21, P32
[16]   A survey on industrial vision systems, applications and tools [J].
Malamas, EN ;
Petrakis, EGM ;
Zervakis, M ;
Petit, L ;
Legat, JD .
IMAGE AND VISION COMPUTING, 2003, 21 (02) :171-188
[17]  
Max E., 2003, METROLOGY PROPERTIES
[18]  
Toal V., 2012, Introduction to Holography
[19]   Dynamic intensity normalization using eigen flat fields in X-ray imaging [J].
Van Nieuwenhove, Vincent ;
De Beenhouwer, Jan ;
De Carlo, Francesco ;
Mancini, Lucia ;
Marone, Federica ;
Sijbers, Jan .
OPTICS EXPRESS, 2015, 23 (21) :27975-27989
[20]   A vision inspection system for the surface defects of strongly reflected metal based on multi-class SVM [J].
Zhang Xue-wu ;
Ding Yan-qiong ;
Lv Yan-yun ;
Shi Ai-ye ;
Liang Rui-yu .
EXPERT SYSTEMS WITH APPLICATIONS, 2011, 38 (05) :5930-5939