Design of n-Type Transparent Conducting Oxides: The Case of Transition Metal Doping in In2O3

被引:72
作者
Xu, Jian [1 ,2 ]
Liu, Jian-Bo [1 ]
Liu, Bai-Xin [1 ]
Li, Shun-Ning [1 ]
Wei, Su-Huai [2 ]
Huang, Bing [2 ]
机构
[1] Tsinghua Univ, Sch Mat Sci & Engn, Key Lab Adv Mat MOE, Beijing 100084, Peoples R China
[2] Beijing Computat Sci Res Ctr, Beijing 100193, Peoples R China
关键词
doping; electronic structures; first-principle calculations; optoelectronic energy applications; transparent conducting oxides; DENSITY PLASMA EVAPORATION; HIGH-MOBILITY; OPTICAL-PROPERTIES; ELECTRONIC-STRUCTURE; FILMS; GROWTH; ITO; TEMPERATURE; DEPOSITION;
D O I
10.1002/aelm.201700553
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Design of novel n-type transparent conducting oxides beyond Sn-doped In2O3 has stimulated extensive interest in the past decade. One of the approaches can be using transition metals (TMs) as dopants. In this article, using In2O3 as an example, it is shown that TM doping in oxides can be classified into three categories (type-I, II, or III) based on their TM d-orbital energy levels reference to the bottom of the conduction band of In2O3. It is found that although Mo is proposed to replace Sn as a promising TM donor to achieve higher carrier density in In2O3, it actually exhibits unusual dual-doping behaviors, i.e., it can act as either a deep donor when it occupies the In 8b-sites (type-I) or shallow single donor when it occupies the In 24d-sites (type-II). The calculated ionization of Mo in In2O3 increases as the growth temperature increases, in good agreement with experimental observations but contradict to previous theoretical studies. It is also identified that Zr, Hf, and Ta (type-III) are better potential donors than Mo and Sn in In2O3 for achieving higher carrier mobility and density. The analysis and approach can also be used to improve the doping performance in other oxides.
引用
收藏
页数:7
相关论文
共 57 条
[1]   Atomic layer deposition growth of zirconium doped In2O3 films [J].
Asikainen, T ;
Ritala, M ;
Leskelä, M .
THIN SOLID FILMS, 2003, 440 (1-2) :152-154
[2]   Effects of Molybdenum Doping and Annealing on the Physical Properties of In2O3 Thin Films [J].
Beji, Nasreddine ;
Souli, Mehdi ;
Reghima, Meriem ;
Azzaza, Sonia ;
Safia, Alleg ;
Kamoun-Turki, Najoua .
JOURNAL OF ELECTRONIC MATERIALS, 2017, 46 (11) :6628-6638
[3]   Origin of High Mobility in Molybdenum-Doped Indium Oxide [J].
Bhachu, Davinder S. ;
Scanlon, David O. ;
Sankar, Gopinathan ;
Veal, T. D. ;
Egdell, Russell G. ;
Cibin, Giannantonio ;
Dent, Andrew J. ;
Knapp, Caroline E. ;
Carmalt, Claire J. ;
Parkin, Ivan P. .
CHEMISTRY OF MATERIALS, 2015, 27 (08) :2788-2796
[4]   IMPROVED TETRAHEDRON METHOD FOR BRILLOUIN-ZONE INTEGRATIONS [J].
BLOCHL, PE ;
JEPSEN, O ;
ANDERSEN, OK .
PHYSICAL REVIEW B, 1994, 49 (23) :16223-16233
[5]   High mobility transparent conducting oxides for thin film solar cells [J].
Calnan, S. ;
Tiwari, A. N. .
THIN SOLID FILMS, 2010, 518 (07) :1839-1849
[6]   THEORY OF THE ATOMIC AND ELECTRONIC-STRUCTURE OF DX CENTERS IN GAAS AND ALXGA1-XAS ALLOYS [J].
CHADI, DJ ;
CHANG, KJ .
PHYSICAL REVIEW LETTERS, 1988, 61 (07) :873-876
[7]   Transparent and semitransparent conducting film deposition by reactive-environment, hollow cathode sputtering [J].
Delahoy, AE ;
Guo, SY .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2005, 23 (04) :1215-1220
[8]   Effect of base and oxygen partial pressures on the electrical and optical properties of indium molybdenum oxide thin films [J].
Elangovan, E. ;
Martins, R. ;
Fortunato, E. .
THIN SOLID FILMS, 2007, 515 (24) :8549-8552
[9]   Resistivity of polycrystalline zinc oxide films: current status and physical limit [J].
Ellmer, K .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2001, 34 (21) :3097-3108
[10]   Carrier transport in polycrystalline ITO and ZnO:Al II:: The influence of grain barriers and boundaries [J].
Ellmer, Klaus ;
Mientus, Rainald .
THIN SOLID FILMS, 2008, 516 (17) :5829-5835