Thickness-modulated passivation properties of PEDOT:PSS layers over crystalline silicon wafers in back junction organic/silicon solar cells

被引：20

作者：

Zhang, Longfei ^{[1
,2
]}

Wang, Zilei ^{[2
,3
]}

Lin, Hao ^{[2
]}

Wang, Wei ^{[2
]}

Wang, Jiajia ^{[2
]}

Zhang, Huan ^{[1
,2
]}

Sheng, Jiang ^{[2
]}

Wu, Sudong ^{[2
]}

Gao, Pingqi ^{[2
]}

Ye, Jichun ^{[2
]}

Yu, Tianbao ^{[1
]}

机构：

[1] Nanchang Univ, Dept Phys, Nanchang 330031, Jiangxi, Peoples R China

[2] Chinese Acad Sci, Ningbo Inst Mat Technol & Engn, Ningbo 315201, Zhejiang, Peoples R China

[3] Lanzhou Univ, Sch Phys Sci & Technol, Lanzhou 730000, Gansu, Peoples R China

来源：

NANOTECHNOLOGY | 2019年 / 30卷 / 19期

基金：

中国国家自然科学基金;

关键词：

PEDOT:PSS/Si heterojunction solar cell; back junction; passivation enhancement; PEDOT:PSS thickness tuning; HOLE-SELECTIVE CONTACTS; TRANSITION-METAL OXIDES; HETEROJUNCTIONS; MOLYBDENUM; V2O5;

D O I：

10.1088/1361-6528/ab012d

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

PEDOT:PSS/silicon heterojunction solar cell has recently attracted much attention due to the fact that it can be simply and cost-effectively fabricated. It is crucial to suppress the interfacial recombination rate between silicon (Si) and organic film for improving device efficiency. In this study, we demonstrated a thickness-dependent passivation effect, i.e. the passivation quality over Si substrate was promoted dramatically with increasing the thickness of PEDOT:PSS layer. The effective minority carrier lifetime increased from 32 mu s for 50 nm to 360 mu s for 200 nm, which corresponds to a change in implied open circuit voltage (VOC-implied) from 545 to 635 mV. Back-junction hybrid solar cells featuring PEDOT:PSS films at rear side were designed to enable adoption of thick PEDOT:PSS layers without having to worry about parasitic absorption, showing a power conversion efficiency (PCE) of 16.3%. Combined with a proper pre-condition on the Si substrate, the back junction hybrid solar cell with 200 nm PEDOT:PSS layer received an enhanced PCE of 16.8%. In addition, the improved long-term stability for the back-junction device was also observed. The PCE remained 90% (unsealed) after being stored in ambient atmosphere for 30 days and over 80% (sealed) after 150 days.

引用

页数：7