Topological Hall effect in diffusive ferromagnetic thin films with spin-flip scattering

被引:12
作者
Zhang, Steven S. -L. [1 ]
Heinonen, Olle [1 ,2 ]
机构
[1] Argonne Natl Lab, Div Mat Sci, Lemont, IL 60439 USA
[2] Northwestern Argonne Inst Sci & Technol, 2145 Sheridan Rd, Evanston, IL 60208 USA
关键词
TEMPERATURE MAGNETIC SKYRMIONS; DYNAMICS;
D O I
10.1103/PhysRevB.97.134401
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We study the topological Hall (TH) effect in a diffusive ferromagnetic metal thin film by solving a Boltzmann transport equation in the presence of spin-flip scattering. A generalized spin-diffusion equation is derived which contains an additional source term associated with the gradient of the emergent magnetic field that arises from skyrmions. Because of the source term, spin accumulation may build up in the vicinity of the skyrmions. This gives rise to a spin-polarized diffusion current that in general suppresses the bulk TH current. Only when the spin-diffusion length is much smaller than the skyrmion size does the TH resistivity approach the value derived by Bruno et al. [Phys. Rev. Lett. 93, 096806 (2004)]. We derive a general expression of the TH resistivity that applies to thin-film geometries with spin-flip scattering, and show that the corrections to the TH resistivity become large when the size of room temperature skyrmions is further reduced to tens of nanometers.
引用
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页数:8
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