Present and Future Applications of Silicon Carbide Devices and Circuits

被引:0
|
作者
Zetterling, Carl-Mikael [1 ]
机构
[1] KTH Royal Inst Technol, Dept Integrated Devices & Circuits, Stockholm, Sweden
来源
2012 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC) | 2012年
关键词
Silicon carbide; high voltage; high temperature;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Silicon Carbide (SiC) is a wide bandgap semiconductor now reaching maturity. Discrete high-voltage SiC devices are commercially available from several suppliers for low-loss power conversion. Future applications may include integrated circuits for high-temperature and radiation-hard applications. This paper introduces SiC material properties, processing, devices, and circuits.
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Progress and Future Challenges of Silicon Carbide Devices for Integrated Circuits
    Kimoto, Tsunenobu
    2014 IEEE PROCEEDINGS OF THE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2014,
  • [2] Silicon carbide devices and processes -: Present status and future perspective
    Ostling, M.
    Lee, H. -S.
    Domeij, M.
    Zetterling, C. -M.
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2006, : 34 - 42
  • [3] High Temperature Gate Drive Circuits for Silicon Carbide Switching Devices
    Wang, Yang
    Krishnamurthy, Shashank
    2013 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2013, : 4258 - 4262
  • [4] Characteristics and Applications of Silicon Carbide Power Devices in Power Electronics
    Kondrath, Nisha
    Kazimierczuk, Marian K.
    INTERNATIONAL JOURNAL OF ELECTRONICS AND TELECOMMUNICATIONS, 2010, 56 (03) : 231 - 236
  • [5] Silicon Carbide Power Devices: Progress and Future Outlook
    Baliga, B. Jayant
    IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS, 2023, 11 (03) : 2400 - 2411
  • [6] Silicon carbide MOSFETs: A critical review of applications, technological advancements, and future perspectives
    Sharmila, P.
    Supraja, G.
    Haripriya, D.
    Sivamani, C.
    Narayana, A. Lakshmi
    MICRO AND NANOSTRUCTURES, 2025, 202
  • [7] Reliability of Silicon Carbide Integrated Circuits at 300°C
    Vert, Alexey V.
    Andarawis, Emad A.
    Chen, Cheng-Po
    SILICON CARBIDE AND RELATED MATERIALS 2011, PTS 1 AND 2, 2012, 717-720 : 1265 - 1268
  • [8] High Temperature Silicon Carbide CMOS Integrated Circuits
    Clark, David T.
    Ramsay, Ewan P.
    Murphy, A. E.
    Smith, D. A.
    Thompson, R. F.
    Young, R. A. R.
    Cormack, J. D.
    Zhu, C.
    Finney, S.
    Fletcher, J.
    SILICON CARBIDE AND RELATED MATERIALS 2010, 2011, 679-680 : 726 - +
  • [9] Silicon carbide: Defects and devices
    Roccaforte, F
    Di Franco, S
    Giannazzo, F
    La Via, F
    Libertino, S
    Raineri, V
    Saggio, M
    Zanetti, E
    GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY XI, 2005, 108-109 : 663 - 670
  • [10] Space qualification of silicon carbide for mirror applications: progress and future objectives
    Palusinski, Iwona A.
    Ghozeil, Isaac
    NOVEL OPTICAL SYSTEMS DESIGN AND OPTIMIZATION IX, 2006, 6289