Nanoelectromechanical Position-Sensitive Detector with Picometer Resolution

被引:19
作者
Chien, Miao-Hsuan [1 ]
Steurer, Johannes [1 ]
Sadeghi, Pedram [1 ]
Cazier, Nicolas [1 ]
Schmid, Silvan [1 ]
机构
[1] TU Wien, Inst Sensor & Actuator Syst, A-1040 Vienna, Austria
基金
欧洲研究理事会;
关键词
in-plane displacement sensor; position-sensitive detector; nanoelectromechanical resonators; photothermal effect; ATOMIC-FORCE MICROSCOPY; SINGLE;
D O I
10.1021/acsphotonics.0c00701
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Subnanometer displacement detection lays the solid foundation for critical applications in modern metrology. In-plane displacement sensing, however, is mainly dominated by the detection of differential photocurrent signals from photodiodes, with resolution in the nanometer range. Here, we present an integrated nanoelectromechanical in-plane displacement sensor based on a nanoelectromechanical trampoline resonator. With a position resolution of 4 pm/root Hz for a low laser power of 85 mu W and a repeatability of 2 nm after five cycles of operation as well as good long-term stability, this new detection principle provides a reliable alternative for overcoming the current position detection limit in a wide variety of research and application fields.
引用
收藏
页码:2197 / 2203
页数:7
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