Transform designs to chips, an end user point of view on mask making

被引:3
|
作者
Chen, John Y. [1 ]
机构
[1] NVIDIA Corp, Santa Clara, CA 95050 USA
来源
PHOTOMASK TECHNOLOGY 2012 | 2012年 / 8522卷
关键词
Performance; Precision; Perfection; Perf/watt; OPC; DFM; CD; Alignment;
D O I
10.1117/12.981267
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Mask is a tool required to replicate a set of complicated IC geometries numerous times producing chips in large volume. It is absolutely crucial to achieve high quality mask in accuracy and perfection. This paper focuses on technology needs which challenge mask-making capabilities including data preparation and Optical Proximity Correction (OPC), Critical Dimension (CD) / Line Edge Roughness (LER) control, alignment and defect elimination. The impact of lithography and mask making on the design and manufacturing of new products is discussed from an end user perspective. The paper emphasizes performance, precision and perfection and the necessity of the three p's for the continuation of Moore's law.
引用
收藏
页数:4
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