Optical constants and polarimetric properties of TiO2-MnO2 thin films

被引：31

作者：

Brus, V. V. ^{[1
]}

Pidkamin, L. J. ^{[2
]}

Abashin, S. L. ^{[3
]}

Kovalyuk, Z. D. ^{[1
]}

Maryanchuk, P. D. ^{[2
]}

Chugai, O. M. ^{[3
]}

机构：

[1] NAS Ukraine, Frantsevich Inst Problems Mat Sci, Chernivtsi Branch, Chernovtsy, Ukraine

[2] Yuriy Fedkovych Chernivtsi Natl Univ, Chernovtsy, Ukraine

[3] Natl Aerosp Univ Kharkiv Aviat Inst, UA-61070 Kharkov, Ukraine

来源：

OPTICAL MATERIALS | 2012年 / 34卷 / 11期

关键词：

Thin films; Transmittance; Scattering matrices; SOLAR-CELL; TIO2;

D O I：

10.1016/j.optmat.2012.06.007

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Optical constants of TiO2-MnO2 (MnO2 content: 0%, 1%, 5%, 10%) thin films prepared by the electron-beam evaporation technique were determined using the envelope method. The optical properties of the TiO2-MnO2 thin films were strongly dependent on the MnO2 content. The TiO2-MnO2 thin films were established to be indirect band semiconductors with the band gap energies Eg: 3.43 eV (TiO2), 2.89 eV (TiO2-MnO2 (1%)) and 2.73 eV (TiO2-MnO2 (5%)). The polarimetric properties of the TiO2-MnO2 thin films were also investigated. (c) 2012 Elsevier B.V. All rights reserved.

引用

页码：1940 / 1945

页数：6

共 30 条

[1] On polarization metrology (estimation) of the degree of coherence of optical waves [J].

Angelsky, O. V. ;

Hanson, S. G. ;

Zenkova, C. Yu. ;

Gorsky, M. P. ;

Gorodyns'ka, N. V. .

OPTICS EXPRESS, 2009, 17 (18) :15623-15634

[2]

[Anonymous], CHERNIVTSI

[3]

[Anonymous], P SPIE

[4]

[Anonymous], P INT C CRIMICO 2011

[5]

[Anonymous], P NASA CP

[6]

[Anonymous], P SPIE

[7] Deposition and modification of titanium dioxide thin films by filtered arc deposition [J].

Bendavid, A ;

Martin, PJ ;

Takikawa, H .

THIN SOLID FILMS, 2000, 360 (1-2) :241-249

[8] Open-circuit analysis of thin film heterojunction solar cells [J].

Brus, V. V. .

SOLAR ENERGY, 2012, 86 (05) :1600-1604

[9] Light-dependent I-V characteristics of TiO2/CdTe heterojunction solar cells [J].

Brus, V. V. ;

Ilashchuk, M. I. ;

Kovalyuk, Z. D. ;

Maryanchuk, P. D. .

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2012, 27 (05)

[10] Comparison of optical properties of TiO2 thin films prepared by reactive magnetron sputtering and electron-beam evaporation techniques [J].

Brus, V. V. ;

Kovalyuk, Z. D. ;

Parfenyuk, O. A. ;

Vakhnyak, N. D. .

SEMICONDUCTOR PHYSICS QUANTUM ELECTRONICS & OPTOELECTRONICS, 2011, 14 (04) :427-431

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