Analytical metrological characterization of the three-parameter sine fit algorithm

被引：17

作者：

Martino, M. ^{[1
,2
]}

Losito, R. ^{[3
]}

Masi, A. ^{[3
]}

机构：

[1] Univ Naples Federico II, Dipartimento Ingn Elettr, I-80125 Naples, Italy

[2] CERN, Dept Technol, CH-1211 Geneva, Switzerland

[3] CERN, Dept Engn, CH-1211 Geneva, Switzerland

来源：

ISA TRANSACTIONS | 2012年 / 51卷 / 02期

关键词：

Sine fit; Least squares fit; Pseudo-inverse; SVD; IEEE; 1241-2000; ADDITIVE NOISE; BIAS;

D O I：

10.1016/j.isatra.2011.10.003

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

The three-parameter sine fit is a well known algorithm used in IEEE standard 1241-2000 for ADC characterization to estimate sine wave parameters from recorded data. An analytical metrological characterization of that algorithm is carried out in terms of its design parameters, namely the sampling rate and the number of samples. Optimal and sub-optimal parameters' sets are found. Focusing on the amplitude estimation, an approximated statistical characterization of the second order is given in the most general case of zero mean additive noise, whereas the exact probability density function is found for the optimal set of algorithm parameters in the case of additive white Gaussian noise. In this particular case, the frequency behavior of the algorithm is fully analyzed and the exact frequency response of the amplitude is also found. An approximated expression that is easier to use is then presented and discussed. Simulation results for a single set of parameters are presented in order to graphically illustrate the analytical results. (C) 2011 ISA. Published by Elsevier Ltd. All rights reserved.

引用

页码：262 / 270

页数：9

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