Scanning Near-field Optical Microscopy, Local probes and enhanced electromagnetic fields

被引：0
|
作者：
Aigouy, L [1 ]
Boccara, AC [1 ]
Ducourtieux, S [1 ]
Gresillon, S [1 ]
Rivoal, JC [1 ]
机构：
[1] Ecole Super Phys & Chim Ind, Lab Opt Phys, F-75231 Paris 05, France
来源：
18TH CONGRESS OF THE INTERNATIONAL COMMISSION FOR OPTICS: OPTICS FOR THE NEXT MILLENNIUM, TECHNICAL DIGEST | 1999年 / 3749卷
关键词：
D O I：
10.1117/12.354851
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Enhanced electromagnetic fields are investigated, both theoretically and experimentally, on two model systems using high spatial resolution. Strong field enhancements at the apex of a tungsten tip illuminated by an external light source are studied as a function of the incident polarization. The surface of percolating random metal-dielectric films consist of several spectral resonances, which have been calculated and are observed here in near field with 10 nm lateral resolution.
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收藏
页码：494 / 495
页数：2
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