A unifying view on some experimental effects in tapping-mode atomic force microscopy

被引：60

作者：

Marth, M ^{[1
]}

Maier, D

Honerkamp, J

Brandsch, R

Bar, G

机构：

[1] Univ Freiburg, Freiburger Mat Forschungszentrum, D-7800 Freiburg, Germany

[2] Univ Freiburg, Fak Phys, D-7800 Freiburg, Germany

[3] Univ Freiburg, Inst Makromol Chem, D-7800 Freiburg, Germany

来源：

JOURNAL OF APPLIED PHYSICS | 1999年 / 85卷 / 10期

关键词：

D O I：

10.1063/1.370508

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Several experimental effects that occur in tapping-mode atomic force microscopy are examined: apparent hysteresis effects in force probes and frequency sweeps and distortions in imaging. It is found through examinations of the phase space that they can all be reduced to one common cause: the existence of more than one stable state of the tip vibration for certain parameters. It is shown that the experimental effects can be explained considering only the phase space under the assumption that measurement noise exists. Numerical simulations confirm the theoretical and experimental findings. (C) 1999 American Institute of Physics. [S0021-8979(99)06010-7].

引用

页码：7030 / 7036

页数：7

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