Photocatalytic property of titanium dioxide thin films deposited by radio frequency magnetron sputtering in argon and water vapour plasma

被引:10
作者
Sirghi, L. [1 ]
Hatanaka, Y. [2 ]
Sakaguchi, K. [3 ]
机构
[1] Alexandru Ioan Cuza Univ, Dept Phys, Iasi 700506, Romania
[2] Shizuoka Univ, Elect Res Inst, Naka Ku, Hamamatsu, Shizuoka 4328011, Japan
[3] Aichi Univ Technol, Fac Engn, Gamagori, Aichi 4430047, Japan
关键词
Sputtering deposition; TiOx thin films; Photocatalytic activity; Hydroxyl groups; SURFACE; OXYGEN;
D O I
10.1016/j.apsusc.2015.04.157
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The present work is investigating the photocatalytic activity of TiO2 thin films deposited by radiofrequency magnetron sputtering of a pure TiO2 target in Ar and Ar/H2O (pressure ratio 40/3) plasmas. Optical absorption, structure, surface morphology and chemical structure of the deposited films were comparatively studied. The films were amorphous and included a large amount of hydroxyl groups (about 5% of oxygen atoms were bounded to hydrogen) irrespective of the intentional content of water in the deposition chamber. Incorporation of hydroxyl groups in the film deposited in pure Ar plasma is explained as contamination of the working gas with water molecules desorbed by plasma from the deposition chamber walls. However, intentional input of water vapour into the discharge chamber decreased the deposition speed and roughness of the deposited films. The good photocatalytic activity of the deposited films could be attributed hydroxyl groups in their structures. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:38 / 41
页数:4
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