High-speed intermittent-contact mode scanning probe microscopy using cantilevers with integrated electrostatic actuator and thermoelectric sensor

被引:0
作者
Sahoo, D. R. [1 ]
Haeberle, W. [1 ]
Baechtold, P. [1 ]
Sebastian, A. [1 ]
Pozidis, H. [1 ]
Eleftheriou, E. [1 ]
机构
[1] IBM Zurich Res Lab, Ruschlikon, Switzerland
来源
2009 AMERICAN CONTROL CONFERENCE, VOLS 1-9 | 2009年
关键词
SURFACE;
D O I
10.1109/ACC.2009.5160608
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Integrated sensing and actuation are pivotal for making high-throughput scanning probe microscopy based devices where a large number of probes are employed for parallel operation. A thermoelectric sensor and an electrostatic-actuation platform fabricated on a cantilever can provide a simple way to integrate sensors and actuators on probes of these devices. The electrostatic actuation facilitates an intermittent-contact mode imaging method which can be implemented for parallel operation of cantilevers. It can improve the durability of these devices and the rate of signal amplitude-loss over time by significantly reducing tip wear. The speed of this method scales with the operating frequency of the cantilever because the imaging data is captured directly from the deflection signal at the oscillation frequency of the cantilever. Traditional intermittent-contact methods are slow, and can not be implemented on a large number of cantilevers because they rely on the demodulation of the cantilever-deflection signal. In the intermittent-contact mode imaging using electrostatic actuation, small-amplitude oscillation is employed for increased speed and reduced tip-sample force. However, significant tip-sample adhesion from soft materials, such as polymers and biological samples restricts the operating frequency of the small-amplitude oscillation and subsequently the throughout of the device. In this paper, an intermittent-contact mode scanning probe microscopy method using electrostatic actuation with input-shaping is presented which can overcome the limitations posed by the adhesive forces. Intermittent-contact operation at the resonant frequency of the cantilever and small cantilever-oscillation within the adhesive region can be achieved by this method. The thermoelectric sensor integrated on the cantilever provides an off-contact signal that can be used in a feedback manner to ensure reliable small-amplitude intermittent-contact mode operation.
引用
收藏
页码:2278 / 2283
页数:6
相关论文
共 23 条
  • [1] Modeling and Identification of the Dynamics of Electrostatically Actuated Microcantilever with Integrated Thermal Sensor
    Agarwal, Pranav
    Sahoo, Deepak
    Sebastian, Abu
    Pozidis, Haris
    Salapaka, Murti V.
    [J]. 47TH IEEE CONFERENCE ON DECISION AND CONTROL, 2008 (CDC 2008), 2008, : 2624 - 2630
  • [2] A high-speed atomic force microscope for studying biological macromolecules
    Ando, T
    Kodera, N
    Takai, E
    Maruyama, D
    Saito, K
    Toda, A
    [J]. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2001, 98 (22) : 12468 - 12472
  • [3] [Anonymous], 1994, SCANNING PROBE MICRO
  • [4] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [5] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY
    BINNING, G
    ROHRER, H
    GERBER, C
    WEIBEL, E
    [J]. PHYSICAL REVIEW LETTERS, 1982, 49 (01) : 57 - 61
  • [6] Fundamentals of micromechanical thermoelectric sensors -: art. no. 044906
    Dürig, U
    [J]. JOURNAL OF APPLIED PHYSICS, 2005, 98 (04)
  • [7] Millipede -: A MEMS-based scanning-probe data-storage system
    Eleftheriou, E
    Antonakopoulos, T
    Binnig, GK
    Cherubini, G
    Despont, M
    Dholakia, A
    Dürig, U
    Lantz, MA
    Pozidis, H
    Rothuizen, HE
    Vettiger, P
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 2003, 39 (02) : 938 - 945
  • [8] Components for high speed atomic force microscopy
    Fantner, Georg E.
    Schitter, Georg
    Kindt, Johannes H.
    Ivanov, Tzvetan
    Ivanova, Katarina
    Patel, Rohan
    Holten-Andersen, Niels
    Adams, Jonathan
    Thurner, Philipp J.
    Rangelow, Ivo W.
    Hansma, Paul K.
    [J]. ULTRAMICROSCOPY, 2006, 106 (8-9) : 881 - 887
  • [9] Tapping mode atomic force microscopy using electrostatic force modulation
    Hong, JW
    Khim, ZG
    Hou, AS
    Park, S
    [J]. APPLIED PHYSICS LETTERS, 1996, 69 (19) : 2831 - 2833
  • [10] A mechanical microscope: High-speed atomic force microscopy
    Humphris, ADL
    Miles, MJ
    Hobbs, JK
    [J]. APPLIED PHYSICS LETTERS, 2005, 86 (03) : 1 - 3