High-throughput synthesis and characterization of anodic oxides on Nb-Ti alloys

被引：39

作者：

Mardare, Andrei Ionut

Savan, Alan ^{[2
]}

Ludwig, Alfred ^{[2
]}

Wieck, Andreas Dirk ^{[2
]}

Hassel, Achim Walter ^{[1
]}

机构：

[1] Max Planck Inst Eisenforsch GmbH, Dept Interface Chem & Surface Engn, D-40237 Dusseldorf, Germany

[2] Ruhr Univ Bochum, D-44780 Bochum, Germany

来源：

ELECTROCHIMICA ACTA | 2009年 / 54卷 / 25期

关键词：

Combinatorial materials libraries; Thin films; Scanning droplet cell; Anodic oxide film; SHAPE-MEMORY BEHAVIOR; MECHANICAL-PROPERTIES; ORTHOPEDIC IMPLANTS; CORROSION BEHAVIOR; FILMS; MICROSTRUCTURE; BREAKDOWN; ALUMINUM; TITANIUM; LAYERS;

D O I：

10.1016/j.electacta.2009.02.104

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Composition spread thin film samples of Nb and Ti were prepared by co-sputtering. The composition range from Nb-5 at.%Ti to Nb-78at.%Ti was achieved and characterized by high resolution field emission scanning electron microscopy and grazing angle X-ray diffraction. Nb stabilized the beta-Ti phase over the entire range studied. The structure was cubic with a continuous change in the lattice constants with composition. Several distinct compositional zones were identified in the as-deposited film morphology. Then, anodic oxides were grown potentiodynamically and characterized by electrochemical impedance spectroscopy using a scanning droplet cell to yield a comprehensive description of oxide film properties including dielectric permittivity, resistivity, thickness and film formation factor. Mott-Schottky analysis of potentiostatically grown oxides showed how the alloy composition influences the flat band potential and the donor density of the mixed n-type semiconducting oxides. Complementary X-ray photo electron spectroscopy as a chemical analysis revealed differences in the oxide compositions as compared to the as-deposited metal resulting from the different ion transport numbers. (C) 2009 Elsevier Ltd. All rights reserved.

引用

页码：5973 / 5980

页数：8

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