Reliability and availability analysis for two non-identical unit parallel systems with common cause failures and human errors

被引:16
作者
Sridharan, V
Mohanavadivu, P
机构
[1] Department of Mathematics, Anna University
来源
MICROELECTRONICS AND RELIABILITY | 1997年 / 37卷 / 05期
关键词
D O I
10.1016/S0026-2714(96)00090-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents three models with common cause failure and human error analysis of a two non-identical unit parallel system. The difference between models I and II is that, in model I the failed system is repaired back to its normal operating state whereas in model II it is not so. Similarly, the basic difference between models II and III is that, in model II it is possible for the partially failed system to be restored to its normal operating state and in model III it is not so. The system reliability, time dependent system availability, steady-state system availability and mean-time to failure are developed for the above models. The problem is discussed with a numerical example. Copyright (C) 1997 Elsevier Science Ltd.
引用
收藏
页码:747 / 752
页数:6
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