Enhancing soft X-ray emission with depleted uranium in neon plasma focus

被引：4

作者：

Khan, H. U. ^{[1
]}

Shafiq, M. ^{[1
]}

Hussain, S. S. ^{[1
]}

Zakaullah, M. ^{[1
]}

机构：

[1] Quaid I Azam Univ, Dept Phys, Islamabad 45320, Pakistan

来源：

EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2009年 / 48卷 / 02期

关键词：

NEUTRON YIELD; GAS; PREIONIZATION; DEVICE; PINCH; ARGON; ENHANCEMENT; MODE;

D O I：

10.1051/epjap/2009136

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Depleted uranium (U(238)) is used for pre-ionization in the neon gas to study the soft X-ray emission in a Mather type plasma focus of 3.3 kJ. The X-rays are detected using an assembly of Quantrad Si pin diodes, masked with differential Ross fitters, and with a multi pinhole camera. The X-ray yield and pinhole images are found strongly influenced by the preionization and the pressure of the working gas. The soft X-ray yield of 82.5 +/- 4.0 J in 1.3-1.56 keV energy window is obtained in the case of preionization of neon gas at the optimum pressure of 5 mbar, leading to the conversion efficiency of 2.5% of the stored energy. The total yield with preionization is 195 +/- 9.0 J in 4 pi geometry measured at the optimum pressure of 5 mbar giving conversion efficiency of 5.9%. The time integrated images indicate the broadening of X-ray emission zone with preionization.

引用

页码：21001p1 / 21001p6

页数：6

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