Magnetic force microscopy study of alternate sputtered (001), oriented L10 phase FePt films

被引：5
|
作者：
Xia Ai-Lin [1 ]
Cao Jiang-Wei
Tong Liu-Niu
Wei Fu-Lin
Yang Zheng
Han Bao-Shan
机构：
[1] Anhui Univ, Sch Mat Sci & Engn, Anhui Key Lab Met Mat & Proc, Maanshan 243002, Peoples R China
[2] Chinese Acad Sci, Inst Phys, State Key Lab Magnetism, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China
[3] Lanzhou Univ, Res Inst Magnet Mat, Lanzhou 730000, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2007年 / 24卷 / 01期
关键词：
D O I：
10.1088/0256-307X/24/1/060
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We present a magnetic force microscopy study of alternate sputtered (001) oriented L1(0) phase FePt films. It is found that the root-mean-square value of phase shift of magnetic force images, can be used to characterize the perpendicular anisotropy for a series of specimens. Therefore, the considerable improvement of the perpendicular anisotropy after post-annealing can be characterized. In addition, the magnetic properties, magnetic and crystalline microstructures before and after post-annealing are compared for the typical [Fe5nmPt5nm](10) film with substrate temperature T-s = 500 degrees C, single layer thickness d = 5 nm and total layer thickness D = 100 nm to confirm the effect of post-annealing on improving the perpendicular anisotropy for Fe-Pt films.
引用
收藏
页码：222 / 225
页数：4
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