Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin force microscopy (vol 94, 223508, 2009)

被引：0
|
作者：
Brunel, David [1 ]
Deresmes, Dominique [1 ]
Melin, Thierry [1 ]
机构：
[1] CNRS, ISEN Dept, IEMN, UMR 8520, F-59652 Villeneuve Dascq, France
来源：
APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 15期
关键词：
Carbon nanotubes; field effect transistors; Atomic force microscopy;
D O I：
10.1063/1.3177322
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页数：1
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