Wideband measurement of extreme impedances with a multistate reflectometer

被引:11
作者
Lewandowski, Arkadiusz [1 ]
LeGolvan, Denis [2 ]
Ginley, Ronald A. [2 ]
Wallis, T. Mitchell [2 ]
Imtiaz, Atif [2 ]
Kabos, Pavel [2 ]
机构
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
[2] Natl Inst Stand & Technol, Electromagnet Div, Boulder, CO 80305 USA
来源
72ND ARFTG MICROWAVE MEASUREMENT SYMPOSIUM: TIME DOMAIN AND FREQUENCY DOMAIN MEASUREMENT | 2008年
关键词
broadband measurements; calibration; high impedance loads;
D O I
10.1109/ARFTG.2008.4804300
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a technique for accurate wideband measurements of one-port devices with extreme impedances. Our technique uses a reflectometer with variable parameters (states) to obtain redundant measurements of the extreme impedance device. We process these measurements using statistical techniques that allow us to exploit the redundancy in order to increase the measurement bandwidth and reduce the measurement uncertainty. We demonstrate our technique for a simple setup containing a power splitter and an unknown variable reference impedance connected to one of its arms and an unknown extreme-impedance device connected to its other arm. The variable reference impedance is realized as either a set of mechanical standards or an electronically tunable impedance. Measurement results show that the repeatability of the reference impedance values is essential for achieving increased accuracy.
引用
收藏
页码:45 / +
页数:2
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