Precision measurement of the 29Si, 33S, and 36Cl binding energies

被引:33
作者
Dewey, MS [1 ]
Kessler, EG
Deslattes, RD
Börner, HG
Jentschel, M
Doll, C
Mutti, P
机构
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[2] Inst Laue Langevin, F-38042 Grenoble, France
来源
PHYSICAL REVIEW C | 2006年 / 73卷 / 04期
关键词
D O I
10.1103/PhysRevC.73.044303
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
The binding energies of Si-29, S-33, and Cl-36 have been measured with a relative uncertainty of < 0.59x10(-6) using a flat-crystal spectrometer. The unique features of these measurements are (1) nearly perfect crystals whose lattice spacing is known in meters, (2) a highly precise angle scale that is derived from first principles, and (3) a gamma-ray measurement facility that is coupled to a high-flux reactor with near-core source capability. The binding energy is obtained by measuring all gamma-rays in a cascade scheme connecting the capture and ground states. The measurements require the extension of precision flat-crystal diffraction techniques to the 5- to 6-MeV energy region, a significant precision measurement challenge. The binding energies determined from these gamma-ray measurements are consistent with recent highly accurate atomic-mass measurements within a relative uncertainty of 4.3x10(-7). The gamma-ray measurement uncertainties are the dominant contributors to the uncertainty of this consistency test. The measured gamma-ray energies are in agreement with earlier precision gamma-ray measurements.
引用
收藏
页数:11
相关论文
共 33 条
[1]   The NUBASE evaluation of nuclear and decay properties [J].
Audi, G ;
Bersillon, O ;
Blachot, J ;
Wapstra, AH .
NUCLEAR PHYSICS A, 2003, 729 (01) :3-128
[2]   MEASUREMENT OF THE SILICON (220) LATTICE SPACING [J].
BASILE, G ;
BERGAMIN, A ;
CAVAGNERO, G ;
MANA, G ;
VITTONE, E ;
ZOSI, G .
PHYSICAL REVIEW LETTERS, 1994, 72 (20) :3133-3136
[3]   ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL [J].
BECKER, P ;
DORENWENDT, K ;
EBELING, G ;
LAUER, R ;
LUCAS, W ;
PROBST, R ;
RADEMACHER, HJ ;
REIM, G ;
SEYFRIED, P ;
SIEGERT, H .
PHYSICAL REVIEW LETTERS, 1981, 46 (23) :1540-1543
[4]   Lattice parameter and thermal expansion of monocrystalline silicon [J].
Bergamin, A ;
Cavagnero, G ;
Mana, G ;
Zosi, G .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (11) :5396-5400
[5]   ULTRA-PRECISE THERMAL-EXPANSION MEASUREMENTS OF 7 LOW EXPANSION MATERIALS [J].
BERTHOLD, JW ;
JACOBS, SF .
APPLIED OPTICS, 1976, 15 (10) :2344-2347
[6]   AN UPDATED EDLEN EQUATION FOR THE REFRACTIVE-INDEX OF AIR [J].
BIRCH, KP ;
DOWNS, MJ .
METROLOGIA, 1993, 30 (03) :155-162
[7]   CORRECTION TO THE UPDATED EDLEN EQUATION FOR THE REFRACTIVE-INDEX OF AIR [J].
BIRCH, KP ;
DOWNS, MJ .
METROLOGIA, 1994, 31 (04) :315-316
[8]   SUBPICOSECOND LIFETIME MEASUREMENTS BY GAMMA-RAY INDUCED DOPPLER BROADENING [J].
BORNER, HG ;
JOLIE, J .
JOURNAL OF PHYSICS G-NUCLEAR AND PARTICLE PHYSICS, 1993, 19 (02) :217-248
[9]   Measurement repetitions of the Si(220) lattice spacing [J].
Cavagnero, G ;
Fujimoto, H ;
Mana, G ;
Massa, E ;
Nakayama, K ;
Zosi, G .
METROLOGIA, 2004, 41 (01) :56-64
[10]   Measurement repetitions of the Si (220) lattice spacing (vol 41, pg 56, 2004) [J].
Cavagnero, G ;
Fujimoto, H ;
Mana, G ;
Massa, E ;
Nakayama, K ;
Zosi, G .
METROLOGIA, 2004, 41 (06) :445-446