Reliability Analysis of Smart Distribution Grid Communication System Based on EPON

被引：0

作者：

Tang, Fei ^{[1
]}

Zha, Xiaoming ^{[1
]}

机构：

[1] Wuhan Univ, Sch Elect Engn, Wuhan 430072, Hubei Province, Peoples R China

来源：

2012 ASIA-PACIFIC POWER AND ENERGY ENGINEERING CONFERENCE (APPEEC) | 2012年

关键词：

reliability; wear-out failure rate; EPON; smart distribution grid;

D O I：

暂无

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

In order to work out an exact value of the EPON(Ethernet Passive Optical Network) reliability in the smart distribution grid communication system, this paper proposed a method from both the micro and macro perspectives to calculate the failure rate and the reliability in smart distribution grid. On the micro, the reliability of optical devices in OLT(Optical Line Terminal) and ONU(Optical Network Unit) has been evaluated in different temperature conditions which is based on GR-468-CORE standard. On the macro, the effect of different architectural protections of communication has also been estimated. Trunk and branch protection in the EPON architecture can effectively improve the total reliability of communication.

引用

页数：4