Ion beam modification and analysis of organometallics dispersed polymer films

被引:11
作者
Qureshi, A
Singh, NL [1 ]
Rakshit, AK
Singh, F
Ganesan, V
机构
[1] Maharaja Sayajirao Univ Baroda, Dept Phys, Baroda 390002, Gujarat, India
[2] Maharaja Sayajirao Univ Baroda, Dept Chem, Baroda 390002, Gujarat, India
[3] Ctr Nucl Sci, New Delhi 110067, India
[4] UGC, DAE, Consortium Sci Res, Indore 452017, India
关键词
polymethyl methacrylate; ferric oxalate; ion irradiation; electrical properties; microhardness; AFM;
D O I
10.1016/j.nimb.2005.11.127
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Thin films of polymethyl methacrylate (PMMA) were synthesized. Ferric oxalate was dispersed in PMMA films at various concentrations. These films were irradiated with 80 MeV O6+ ions at a fluence of 1 x 10(11) ions/cm(2). The radiation induced changes in electrical conductivity, microhardness, surface roughness are investigated in the paper. It is observed that hardness and electrical conductivity of the film increases with the concentration of dispersed ferric oxalate and also with the fluence. It indicates that ion beam irradiation promotes (i) the metal to polymer bonding (ii) convert the polymeric structure in to hydrogen depleted carbon network. Thus irradiation makes the polymer more hard and more conductive. Atomic force microscopy shows that average roughness (R.) of the irradiated film is lower than the unirradiated one. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:235 / 238
页数:4
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