Digital detection systems for projection radiography.

被引：11

作者：

Schulz, RF ^{[1
]}

机构：

[1] Siemens AG, Med Solut, RVM4, D-91050 Erlangen, Germany

来源：

ROFO-FORTSCHRITTE AUF DEM GEBIET DER RONTGENSTRAHLEN UND DER BILDGEBENDEN VERFAHREN | 2001年 / 173卷 / 12期

关键词：

digital X-ray detector; digital radiography; amorphous silicon; solid-state detector; flat-panel detector; survey;

D O I：

10.1055/s-2001-18899

中图分类号：

R8 [特种医学]; R445 [影像诊断学];

学科分类号：

1002 ; 100207 ; 1009 ;

摘要：

This article gives a survey of digital X-ray detection systems for projection radiography. The different principles are compared and some general characteristics are derived. The basic conversion mechanisms in the absorption layers are described. The basic principles of solid state X-ray detectors and their general characteristics are elucidated as well as some similarities with detectors for computed tomography. Some important application and system aspects are considered. An outlook on further possible developments in this field is given.

引用

页码：1137 / 1146

页数：10

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