Doping of silicate glasses with erbium by a field-assisted solid-state ion exchange technique

被引：12

作者：

Cattaruzza, E. ^{[1
]}

Battaglin, G. ^{[1
]}

Gonella, F. ^{[1
]}

Maurizio, C. ^{[2
]}

Ali, S. ^{[3
]}

Trave, E. ^{[3
]}

机构：

[1] Univ Ca Foscari Venezia, Dipartimento Chim Fis, I-30123 Venice, Italy

[2] European Synchrotron Radiat Facil, CNR, INFM, OGG, F-38043 Grenoble, France

[3] Univ Padua, Dipartimento Fis, I-35131 Padua, Italy

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2009年 / 42卷 / 04期

关键词：

DIFFUSION; ER3+;

D O I：

10.1088/0022-3727/42/4/045301

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A field-assisted solid-state ion exchange technique is used for the first time to dope surface layers of silicate glasses with erbium at the concentration of the order of a few 10(20) Er cm(-3). Rutherford backscattering spectrometry, extended x-ray absorption fine structure spectroscopy and photoluminescence spectroscopy are used to characterize the samples treated after erbium oxide films were formed on soda-lime glass slides.

引用

页数：5

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