Magnetoresistance Investigations in Exchange-Biased IrMn/NiFe Bilayers

被引：0

作者：

Fulara, Himanshu ^{[1
]}

Chaudhary, Sujeet ^{[1
]}

Kashyap, Subhash C. ^{[1
]}

机构：

[1] Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India

来源：

SOLID STATE PHYSICS, VOL 57 | 2013年 / 1512卷

关键词：

Magnetoresistance; Ion-beam sputtering; Training effect; Reversal asymmetry;

D O I：

10.1063/1.4791469

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Magnetoresistance measurements have been employed to demonstrate the thermal evolution of exchange bias, reversal asymmetry and training effect in ion-beam sputtered IrMn/NiFe bilayers. Magnetoresistance investigations have shown a significant increase in exchange bias field and coercivity, pronounced reversal asymmetry and, most prominently, a strong training effect all occurring at low temperature (T < 50 K). These experimental results are attributed to the occurrence of temperature dependent crossover from uniaxial to biaxial anisotropy in the IrMn layer.

引用

页码：1178 / 1179

页数：2

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