Electrochemical and mechanical behaviour of Sn-2.5Ag-0.5Cu and Sn-48Bi-2Zn solders

被引:31
作者
Montesperelli, G. [1 ,2 ]
Rapone, M. [1 ,2 ]
Nanni, F. [1 ,2 ]
Travaglia, P. [1 ,2 ]
Riani, P. [3 ,4 ]
Marazza, R. [3 ,4 ]
Gusmano, G. [1 ,2 ]
机构
[1] Unita Ric Roma Tor Vergata, Consorzio INSTM, Rome, Italy
[2] Univ Roma Tor Vergata, Dipartimento Sci & Tecnol Chim, I-00173 Rome, Italy
[3] Univ Genoa, Dipartimento Chim & Chim Ind, Genoa, Italy
[4] Univ Genoa, Unita Ric Genova, Consorzio INSTM, Genoa, Italy
来源
MATERIALS AND CORROSION-WERKSTOFFE UND KORROSION | 2008年 / 59卷 / 08期
关键词
D O I
10.1002/maco.200804098
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper, two tin-based alloys (Sn-2.5Ag-0.5Cu and Sn-48Bi-2Zn) are proposed as new lead-free solders. Alloys have been developed by melting pure elements. Samples have been evaluated in terms of microstructure, corrosion resistance and mechanical features. Corrosion tests have been performed in 3% NaCl solution by polarization curves and electrochemical impedance spectroscopy (EIS). SEM observations and EDS analysis were carried out on samples before and after corrosion tests. Static monotonic tensile tests have been performed on three specimens for each alloy. SEM and EDS analysis revealed the presence of Sn-Ag and Sn-Cu intermetallic compounds within the Sn-Ag-Cu alloy. As a result of corrosion test, the Sn-Ag-Cu alloy showed a better corrosion resistance with respect to Sn-Bi-Zn. Both alloys evidenced good mechanical properties higher than the traditional Sn-Pb system. Sn-Ag-Cu seems to be a suitable soldering material.
引用
收藏
页码:662 / 669
页数:8
相关论文
共 17 条
[1]   Lead-free solders in microelectronics [J].
Abtew, M ;
Selvaduray, G .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 27 (5-6) :95-141
[2]   Mechanical characterization of Sn-Ag-based lead-free solders [J].
Amagai, M ;
Watanabe, M ;
Omiya, M ;
Kishimoto, K ;
Shibuya, T .
MICROELECTRONICS RELIABILITY, 2002, 42 (06) :951-966
[3]  
*ASM INT, 1985, ASM HDB, V9, P456
[4]  
*ASM INT MET PARK, 1985, ASM HDB, V9, P455
[5]   Electrochemical behaviors of the Sn-9Zn-xAg lead-free solders in a 3.5 wt % NaCl solution [J].
Chang, TC ;
Hon, MH ;
Wang, MC ;
Lin, DY .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2004, 151 (07) :C484-C491
[6]   Technical note:: Concerning the conversion of the constant phase element parameter Y0 into a capacitance [J].
Hsu, CH ;
Mansfeld, F .
CORROSION, 2001, 57 (09) :747-748
[7]   EFFECTS OF FE, NI AND SN ON REACTION DIFFUSION AT SOLDER/CU-BASE-ALLOYS INTERFACE [J].
INABA, M ;
HONMA, Y ;
TESHIMA, K ;
HIRAO, O ;
SAKURAI, T .
JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1984, 48 (09) :863-870
[8]   Effect of composition and cooling rate on microstructure and tensile properties of Sn-Zn-Bi alloys [J].
Kim, YS ;
Kim, KS ;
Hwang, CW ;
Suganuma, K .
JOURNAL OF ALLOYS AND COMPOUNDS, 2003, 352 (1-2) :237-245
[9]   Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders [J].
Lin, CK ;
Chu, DY .
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2005, 16 (06) :355-365
[10]   The electrochemical corrosion behaviour of Pb-free Al-Zn-Sn solders in NaCl solution [J].
Lin, KL ;
Liu, TP .
MATERIALS CHEMISTRY AND PHYSICS, 1998, 56 (02) :171-176