A self-tuning DVS processor using delay-error detection and correction

被引:257
作者
Das, S [1 ]
Roberts, D
Lee, S
Pant, S
Blaauw, D
Austin, T
Flautner, K
Mudge, T
机构
[1] Univ Michigan, Ann Arbor, MI 48109 USA
[2] ARM Ltd, Cambridge CB1 9NJ, England
关键词
dynamic voltage scaling (DVS); error detection and correction; self-tuning processor; voltage safety margins;
D O I
10.1109/JSSC.2006.870912
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we present a dynamic voltage scaling (DVS) technique called Razor which incorporates an in situ error detection and correction mechanism to recover from timing errors. We also present the implementation details and silicon measurements results of a 64-bit processor fabricated in 0.18-mu m technology that uses Razor for supply voltage control. Traditional DVS techniques require significant voltage safety margins to guarantee computational correctness at the worst case combination of process, voltage and temperature conditions, leading to a loss in energy efficiency. In Razor-based DVS, however, the supply voltage is automatically reduced to the point of first failure using the error detection and correction mechanism, thereby eliminating safety margins while still ensuring correct operation. In addition, the supply voltage can be intentionally scaled below the point of first failure of the processor to achieve an optimal tradeoff between energy savings from further voltage reduction and energy overhead from increased error detection and correction activity. We tested and measured savings due to Razor DVS for 33 different dies and obtained an average energy savings of 50% over worst case operating conditions by scaling supply voltage to achieve a 0.1% targeted error rate, at a fixed frequency of 120 MHz.
引用
收藏
页码:792 / 804
页数:13
相关论文
共 13 条
[1]   A dynamic voltage scaled microprocessor system [J].
Burd, TD ;
Pering, TA ;
Stratakos, AJ ;
Brodersen, RW .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2000, 35 (11) :1571-1580
[2]   LOW-POWER CMOS DIGITAL DESIGN [J].
CHANDRAKASAN, AP ;
SHENG, S ;
BRODERSEN, RW .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1992, 27 (04) :473-484
[3]  
Dally W.J., 1998, Digital System Engineering
[4]  
Das S, 2005, 2005 Symposium on VLSI Circuits, Digest of Technical Papers, P258
[5]  
Ernst D, 2003, 36TH INTERNATIONAL SYMPOSIUM ON MICROARCHITECTURE, PROCEEDINGS, P7
[6]   Supply and threshold voltage scaling for low power CMOS [J].
Gonzalez, R ;
Gordon, BM ;
Horowitz, MA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1997, 32 (08) :1210-1216
[7]   Variable supply-voltage scheme for low-power high-speed CMOS digital design [J].
Kuroda, T ;
Suzuki, K ;
Mita, S ;
Fujita, T ;
Yamane, F ;
Sano, F ;
Chiba, A ;
Watanabe, Y ;
Matsuda, K ;
Maeda, T ;
Sakurai, T ;
Furuyama, T .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (03) :454-462
[8]   Power: A first-class architectural design constraint [J].
Mudge, T .
COMPUTER, 2001, 34 (04) :52-+
[9]   Dynamic voltage and frequency management for a low-power embedded microprocessor [J].
Nakai, M ;
Akui, S ;
Seno, K ;
Meguro, T ;
Seki, T ;
Kondo, T ;
Hashiguchi, A ;
Kawahara, H ;
Kumano, K ;
Shimura, M .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2005, 40 (01) :28-35
[10]   A 32-bit PowerPC system-on-a-chip with support for dynamic voltage scaling and dynamic frequency scaling [J].
Nowka, KJ ;
Carpenter, GD ;
MacDonald, EW ;
Ngo, HC ;
Brock, BC ;
Ishii, KI ;
Nguyen, TY ;
Burns, JL .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2002, 37 (11) :1441-1447